V. Morazzani

The European nanometrology landscape

R. Leach, K. Dirscherl, R. Boyd, 2011, Nanotechnology.

Analysis of the surfaces structure in porous Si

V. Morazzani, H. Bardeleben, H. Münder, 1995 .

Ion beam analysis of thin films. Applications to porous silicon

V. Morazzani, A. Grosman, C. Ortega, 1995 .

A characterisation of the morphology of porous silicon films by proton energy loss fluctuation measurements with a narrow resonance in the 15N(p,αγ)12C reaction☆

V. Morazzani, G. Battistig, C. Ortega, 1997 .