K. B. Albers

Propagation comparisons at VHF and UHF frequencies

Thomas Weston Burress, W. Kuhn, Xiaohu Zhang, 2009, 2009 IEEE Radio and Wireless Symposium.

Noise characterization of transistors in 0.25μm and 0.5μm silicon-on-sapphire processes

K. B. Albers, 2010 .