V. Hegemann

The Power of two Tests for Nonadditivity

Dallas Johnson, V. Hegemann, 1976 .

On Analyzing Two-Way AoV Data with Interaction

Dallas Johnson, V. Hegemann, Dallas E. Johnson, 1976 .

Metrology control for an advanced 200 mm sub-micron wafer fab

V. Hegemann, S. E. Haider, Faa‐Ching Wang, 1995, Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'.

Procedures to generate random matrices with noncentral distributions

Dallas Johnson, V. Hegemann, 1974 .