B. Johs

发表

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis

P. G. Snyder, Y. Kao, C. M. Herzinger, 1995 .

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

R. Synowicki, C. M. Herzinger, J. Woollam, 2003 .

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

J. D. Benson, John H. Dinan, B. Johs, 1998 .

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, John A. Woollam, B. Johs, 1998 .

Dielectric function representation by B‐splines

Blaine D. Johs, B. Johs, J. Hale, 2008 .

Dielectric function spectra of GaN, AlGaN, and GaN/AlGaN heterostructures

K. Köhler, J. Wagner, B. Johs, 2001 .

Spectroscopic Ellipsometry Analysis of InGaN/GaN and AlGaN/GaN Heterostructures Using a Parametric Dielectric Function Model

K. Köhler, J. Wagner, B. Johs, 1999 .

Spectroscopic Ellipsometry Analysis of InGaN/GaN and AlGaN/GaN Heterostructures Using a Parametric Dielectric Function Model

K. Köhler, J. Wagner, B. Johs, 1999 .

Real time in situ composition control of InGaAs lattice matched to InP by an 88-wavelength ellipsometer

Yong-Hang Zhang, B. Johs, Yong-Hang Zhang, 1998 .

Use of spectroscopic ellipsometry for feedback control during the growth of thin AlAs layers

Yong-Hang Zhang, Shane R. Johnson, B. Johs, 1999 .

Piezoelectric field and confinement effects on the dielectric function spectrum of InGaN/GaN quantum wells

K. Köhler, J. Wagner, B. Johs, 2000 .

Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations

R. Collins, S. Marsillac, B. Johs, 2012, 2012 38th IEEE Photovoltaic Specialists Conference.

Quantifying the accuracy of ellipsometer systems

C. M. Herzinger, B. Johs, C. Herzinger, 2008 .

Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation

S. Liou, J. Woollam, B. Johs, 1989 .

Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

P. Bos, Doug Bryant, C. M. Herzinger, 2004 .

Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs

P. G. Snyder, J. Woollam, B. Johs, 1995 .

Films of indium tin oxide (ITO) are ubiquitous in display applications as they combine optical

W. McGahan, J. Woollam, B. Johs, 2016 .

Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry

P. G. Snyder, Y. Kao, C. M. Herzinger, 1996 .

InP optical constants between 0.75 and 5.0 eV determined by variable‐angle spectroscopic ellipsometry

Craig M. Herzinger, John A. Woollam, Paul G. Snyder, 1995 .

Preparation of high Tc Tl‐Ba‐Ca‐Cu‐O thin films by pulsed laser evaporation and Tl2O3 vapor processing

S. Liou, A. Hermann, J. Woollam, 1989 .

In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper)

John A. Woollam, Paul G. Snyder, Blaine D. Johs, 1992, Other Conferences.

A neutron reflectivity investigation of surface and interface segregation of polymer functional end groups

J. Koberstein, T. Long, B. Johs, 1994 .

Modeling AlxGa1−xAs optical constants as functions of composition

John A. Woollam, Paul G. Snyder, Blaine D. Johs, 1990 .

Optical properties of soda-lime float glass from spectroscopic ellipsometry

Andrew C. Martin, R. Synowicki, B. Johs, 2011 .

Application of spectroscopic ellipsometry for real-time control of CdTe and HgCdTe growth in an OMCVD system

I. Bhat, B. Johs, P. He, 1995 .

A multi-sample, multi-wavelength, multi-angle investigation of the interface layer between silicon and thermally grown silicon dioxide

Craig M. Herzinger, B. Johs, Wayne M. Paulson, 1998 .

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2

Craig M. Herzinger, Mathias Schubert, John A. Woollam, 1996 .

Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films

John A. Woollam, Blaine D. Johs, William A. McGahan, 1993 .

General virtual interface algorithm for in-situ spectroscopic ellipsometric data analysis

B. Johs, 2004 .

Integrated multi-sensor system for real-time monitoring and control of HgCdTe MBE

G. L. Olson, Rajesh D. Rajavel, John A. Roth, 1999 .

Spectroscopic Ellipsometry Study of HgCdTe Epilayer Surfaces During Electron Cyclotron Resonance Plasma Etching

B. Johs, M. Martinka, J. Dinan, 1996 .

In situ spectroscopic ellipsometry studies of electron cyclotron resonance (ECR) plasma etching of oxides of silicon and GaAs

P. G. Snyder, S. Nafis, J. Woollam, 1993 .

In-Situ Spectroscopic Ellipsometry Applied to ZnSe and ZnCdSe Growth Process in Organometallic Vapor Phase Epitaxy

J. Woollam, B. Johs, J. Iacoponi, 1992 .

In Situ spectroscopic ellipsometry in molecular beam epitaxy

K. Shiralagi, G. Maracas, R. Droopad, 1992 .

Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors

Gerald T. Cooney, K. Shiralagi, G. Maracas, 1991 .

MBE growth of HgCdTe avalanche photodiode structures for low-noise 1.55 μm photodetection

Andrew T. Hunter, G. L. Olson, G. R. Chapman, 1999 .

Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements

B. Johs, N. Ianno, G. Pribil, 2004 .

Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

John A. Woollam, Corey L. Bungay, James N. Hilfiker, 1999, Optics + Photonics.

Ellipsometric Monitoring of Defects Induced by Electron Cyclotron Resonance Etching of GaAs

P. G. Snyder, J. Woollam, B. Johs, 1995 .

Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry

P. G. Snyder, W. McGahan, S. Nafis, 1993 .

In Situ Studies of Electron Cyclotron Resonance Plasma Etching of Semiconductors by Spectroscopic Ellipsometry

P. G. Snyder, S. Nafis, J. Woollam, 1992 .

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

Corey L. Bungay, James N. Hilfiker, Ron A. Synowicki, 1999, Optics + Photonics.

Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials

J. Woollam, B. Johs, W. A. McGaham, 1994 .

In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor

Gerald T. Cooney, P. G. Snyder, G. Maracas, 1990 .

Recent developments in spectroscopic ellipsometry for in-situ applications

Craig M. Herzinger, John A. Woollam, Jeff Hale, 2001, SPIE Optics + Photonics.

Ellipsometric analysis of CdZnTe preparation for HgCdTe MBE growth

A. Cornfeld, P. He, J. Benson, 1997 .

In-situ spectroscopic ellipsometry of HgCdTe

John A. Woollam, J. D. Benson, P. R. Boyd, 1996 .

Accuracy of color determination from spectroscopic ellipsometry measurements

H. Arwin, T. Wagner, B. Johs, 2011 .

Optical analysis of complex multilayer structures using multiple data types

John A. Woollam, Roger H. French, Franklin D. Kalk, 1994, Other Conferences.

In situ and Ex situ Applications of Spectroscopic Ellipsometry

P. G. Snyder, J. Woollam, H. Yao, 1993 .

Characterization of biaxially-stretched plastic films by generalized ellipsometry

Craig M. Herzinger, Blaine D. Johs, C. M. Herzinger, 1998 .

Generalized transmission ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals

Craig M. Herzinger, Mathias Schubert, John A. Woollam, 1996 .

Ultrahigh purity conditions for nitride growth with low oxygen content by plasma-enhanced atomic layer deposition

G. Rayner, B. Johs, J. Shallenberger, 2020 .

Pulsed laser deposition of Tl-Ca-Ba-Cu-O films

John A. Woollam, Daniel W. Thompson, Natale J. Ianno, 1990, Defense, Security, and Sensing.

Pulsed Laser Deposition of HTSC Thallium Films

John A. Woollam, Daniel W. Thompson, N. J. Ianno, 1990, Other Conferences.

Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films

S. Liou, J. Woollam, B. Johs, 1989 .

Automated compositional control of Hg1−xCdxTe during MBE, using in situ spectroscopic ellipsometry

J. D. Benson, John H. Dinan, B. Johs, 1998 .

Control of etch depth in patterned semiconductor substrates using real time spectroscopic ellipsometry

P. G. Snyder, C. M. Herzinger, B. Johs, 2004 .

Etch depth control in bulk GaAs using patterning and real time spectroscopic ellipsometry

P. G. Snyder, C. M. Herzinger, B. Johs, 2002 .

Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data.

Kenneth Järrendahl, Hans Arwin, H. Arwin, 2013, Optics express.

Variable Angle Spectroscopic Ellipsometry Studies of HgI 2

H. Yao, B. Johs, 1993 .

Real-time in situ ellipsometric monitoring of aluminum nitride film growth via hollow-cathode plasma-assisted atomic layer deposition

N. Biyikli, D. Shukla, B. Willis, 2019, Journal of Vacuum Science & Technology A.

Effects of ordering on the optical properties of GaInP2

John F. Geisz, Dean H. Levi, Blaine Johs, 2004, SPIE Optics + Photonics.

Real-time control of the MBE growth of InGaAs on InP

J. A. Roth, W. Williamson, D. Chow, 1999 .

Real time in-situ thickness control of Fabry—Perot cavities in MBE by 44 and 88 wavelength ellipsometry

D. Schroder, G. Maracas, B. Johs, 1997 .

Real-time Monitoring of semiconductor growth by Spectroscopic ellipsometry

J. A. Roth, I. Ferguson, B. Johs, 1997 .