T. Saito

发表

U. Feldmann, H. Mattausch, M. Miura-Mattausch, 2019, IEEE Transactions on Electron Devices.
M. Terai, S. Fujieda, T. Saito, 2010, IEEE Transactions on Electron Devices.
Y. Tsunashima, K. Matsuo, A. Yagishita, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
K. Matsuo, K. Suguro, T. Itani, 2003, 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
K. Sato, T. Oshima, H. Aoki, 2004, IEEE Transactions on Electron Devices.
J. Noguchi, T. Saito, T. Oshima, 2005, Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005..
K. Torii, J. Noguchi, K. Hinode, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
J. Noguchi, T. Saito, T. Oshima, 2006, 2006 International Interconnect Technology Conference.
N. Ohashi, J. Noguchi, T. Saito, 1998, Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102).
K. Matsuo, A. Yagishita, K. Suguro, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
K. Hinode, H. Maruyama, N. Ohashi, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
E. Murakami, T. Oshima, K. Hinode, 2002, Digest. International Electron Devices Meeting,.
K. Sato, T. Oshima, H. Aoki, 2005, IEEE Transactions on Electron Devices.
J. Noguchi, T. Saito, T. Oshima, 2004, Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).
Y. Tsunashima, A. Yagishita, K. Suguro, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
M. Hiratani, T. Saito, I. Asano, 2001, 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
T. Saito, S. Hojo, H. Shimizu, 2021, 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD).