Thomas Rohe

System qualification and optimization for imaging performance on the 0.80-NA 248-nm step-and-scan systems

Koen van Ingen Schenau, Hans Bakker, Mark Zellenrath, 2002, SPIE Advanced Lithography.

Performance of a high-NA dual-stage 193-nm TWINSCAN Step and Scan system for 80-nm applications

Steven G. Hansen, Eelco van Setten, Dan Smith, 2003, SPIE Advanced Lithography.

Quantitatives Frequent Pattern Mining in drahtlosen Sensornetzen

Kai-Uwe Sattler, Thomas Rohe, Daniel Klan, 2011, BTW Workshops.

Factoring als Instrument der Liquiditätsbeschaffung in der Insolvenz

Thomas Rohe, 2018 .

Quantitatives Frequent-Pattern Mining über Datenströmen

Thomas Rohe, Daniel Klan, T. Rohe, 2010, LWA.