Steffen Rochel

Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence

David Blaauw, Dennis Sylvester, Vineeth Veetil, 2009, 2009 46th ACM/IEEE Design Automation Conference.

Clock verification in the presence of IR-drop in the power distribution network

David Overhauser, Resve Saleh, Steffen Rochel, 1999, Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327).

Full-chip verification methods for DSM power distribution systems

David Overhauser, Steffen Rochel, S. Z. Hussain, 1998, Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175).

Substrate and phase noise characterization

Hidetoshi Onodera, Steffen Rochel, 2005, CICC.

Clock skew verification in the presence of IR-drop in the powerdistribution network

Resve A. Saleh, David Overhauser, Steffen Rochel, 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Full-chip reliability analysis

David Overhauser, Steffen Rochel, S. Z. Hussain, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

Design Aspects using ELDO

Steffen Rochel, 1994 .

Full-chip reliability analysis

David Overhauser, Steffen Rochel, S. Z. Hussain, 1998 .

Power distribution in high-performance design

David Overhauser, Steffen Rochel, Sandy Taylor, 1998, Proceedings. 1998 International Symposium on Low Power Electronics and Design (IEEE Cat. No.98TH8379).

Full-chip signal interconnect analysis for electromigration reliability

Steffen Rochel, N. S. Nagaraj, 2000, Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525).

Behavioral modeling and simulation of mixed-signal circuits

Steffen Rochel, 1995 .