S. Duzellier

发表

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations

P. Peronnard, L. Artola, G. Hubert, 2011, IEEE Transactions on Nuclear Science.

SEE in-flight measurement on the MIR orbital station. [Single Event Effects]

Robert Ecoffet, S. Duzellier, D. Falguere, 1994 .

Multi-scale modeling to investigate the single event effects for space missions ☆ ☆☆

L. Artola, J.-F. Roussel, S. Duzellier, 2011 .

Standards for space radiation environments and effects

G. Reitz, S. Duzellier, E. Daly, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

SEETEST : A. SYSTEM DE DICAT ED TO THE CHA R ACTERIS ATION OF WORY SE;JVSITIVITY TO SF&

S. Duzellier, D. Falguere, 1992 .

Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces

S. Duzellier, Florence Malou, Francisco Bezerra, 2002 .

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

R. Harboe-Sorensen, C. Poivey, S. Duzellier, 2008, IEEE Transactions on Nuclear Science.

Management of radiation issues for using commercial non-hardened parts on the INTEGRAL Spectrometer project

L. Guibert, E. Vergnault, Robert Ecoffet, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

Heavy ion test results on memories

Robert Ecoffet, S. Duzellier, D. Falguere, 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.

Memories response toMBU and Semi-empirical approach forSEErate calculation

Robert Ecoffet, S. Duzellier, T. Nuns, 2005 .

Heavy ion component test coordination

Robert Ecoffet, S. Duzellier, M. Romero, 1991, RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems.

SEETEST: a system dedicated to the characterisation of memory sensitivity to SEE

S. Duzellier, D. Falguere, 1991, RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems.

EXEQ I-IV: SEE in-flight measurement on the MIR orbital station

Robert Ecoffet, S. Duzellier, D. Falguere, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

Collected charge analysis for a new advanced transient model by TCAD simulation in 90nm technology

L. Artola, G. Hubert, S. Duzellier, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

An overview of the applications of a pulsed laser system for SEU testing

Hervé Lapuyade, Dean Lewis, S. Duzellier, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

EXEQ II and III: On-board experiments for the study of single events

Robert Ecoffet, S. Duzellier, D. Falguere, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

SEE in-flight data for two static 32KB memories on high earth orbit

Raoul Velazco, Robert Ecoffet, B. Nicolescu, 2002, IEEE Radiation Effects Data Workshop.

Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits

Raoul Velazco, Robert Ecoffet, S. Duzellier, 1994 .

Radiation Testing of Electronics Systems: How Can Simulation Tools Help in the Definition and Optimization of Test Plans in Labs?

Guillaume Hubert, S. Duzellier, T. Nuns, 2016 .

One year SEU flight results for two 32KB commercial SRAMs on-board a scientific satellite

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1999 .

0.6 /spl mu/m CMOS technology with radiation tolerant features application to 8 K/spl times/16 dual port RAM and sea of gates

R. Ecoffet, S. Duzellier, T. Corbiere, 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

F. Wrobel, M. Gaillardin, G. Hubert, 2013, IEEE Transactions on Nuclear Science.

Estimation of upset sensitive volume thickness and critical energy using low energy heavy-ion beams

S. Duzellier, C. Inguimbert, R. Ecoffet, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

Evaluation of recent technologies of non-volatile RAM

V. Pouget, G. Hubert, S. Duzellier, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

Heavy ions induced latent stuck bits revealed by total dose irradiation in 4T cells SRAMs

S. Duzellier, J. P. David, J. G. Loquet, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Radiation environment measurements with SPICA on-board the MIR station

Robert Ecoffet, S. Duzellier, T. Nuns, 2002 .

Memories Response to MBU and Semi-Empirical Approach for SEE Rate Calculation

S. Duzellier, T. Nuns, D. Falguere, 2005, IEEE Transactions on Nuclear Science.

In-flight observations of the radiation environment and its effects on devices in the SAC-C polar orbit

Robert Ecoffet, S. Duzellier, T. Nuns, 2002 .

Evaluation of the upset risk in CMOS SRAM through full three dimensional simulation

J. Gasiot, S. Duzellier, Y. Moreau, 1995 .

Probing With Heavy Ions the SET Sensitivity of Linear Devices

D. Dangla, S. Duzellier, T. Nuns, 2008, IEEE Transactions on Nuclear Science.

Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ${\rm SEP}^{3}$)

G. Hubert, S. Duzellier, C. Inguimbert, 2009, IEEE Transactions on Nuclear Science.

Using a carbon beam as a probe to extract the thickness of sensitive volumes

Robert Ecoffet, S. Duzellier, C. Inguimbert, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Simulation of heavy-ion-induced failure modes in nMOS cells of ICs

S. Duzellier, T. Nuns, D. Falguere, 2001 .

Evaluation of Recent Technologies of Nonvolatile RAM

V. Pouget, G. Hubert, S. Duzellier, 2008, IEEE Transactions on Nuclear Science.

Low LET cross-section measurements using high energy carbon beam [DRAMs/SRAMs]

Robert Ecoffet, S. Duzellier, D. Falguere, 1997 .

Proton upset rate simulation by a Monte Carlo method: importance of the elastic scattering mechanism

S. Duzellier, C. Inguimbert, R. Ecoffet, 1997 .

Radiation environment measurements with SPICA on-board the MIR station

S. Duzellier, T. Nuns, D. Falguere, 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).

Protons and heavy ions induced stuck bits on large capacity RAMs

Robert Ecoffet, S. Duzellier, D. Falguere, 1993, RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3).

Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEP$^{3}$

L. Artola, G. Hubert, R. Velazco, 2013, IEEE Transactions on Nuclear Science.

An empirical model for predicting proton induced upset

Robert Ecoffet, S. Duzellier, D. Falguere, 1996 .

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

E. G. Stassinopoulos, Robert Ecoffet, S. Duzellier, 1994 .

ICARE on-board SAC-C: More than 8 years of SEU & MCU, analysis and prediction

G. Hubert, S. Duzellier, R. Ecoffet, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

Robert Ecoffet, S. Duzellier, C. Inguimbert, 2002 .

Recent trends in single-event effect ground testing

S. Duzellier, R. Ecoffet, R. Ecoffet, 1996 .

SEE results using high energy ions

Robert Ecoffet, S. Duzellier, D. Falguere, 1995 .

SEU rate calculation with GEANT4 (comparison with CREME 86)

S. Duzellier, C. Inguimbert, C. Inguimbert, 2004, IEEE Transactions on Nuclear Science.

Low energy proton induced SEE in memories

Wojtek Hajdas, S. Duzellier, T. Nuns, 1997 .

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

S. Duzellier, C. Inguimbert, R. Ecoffet, 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).

Test Facilities for SEE and Dose Testing

S. Duzellier, G. Berger, S. Duzellier, 2007 .

MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications

G. Hubert, S. Duzellier, F. Bezerra, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Observation of heavy ion induced transients in linear circuits

Robert Ecoffet, S. Duzellier, P. Tastet, 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.

Heavy Ton / Proton Test Results On High Integrated Memories

S. Duzellier, R. Ecoffet, D. FaIguere, 1993, 1993 IEEE Radiation Effects Data Workshop.

Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs

V. Pouget, Robert Ecoffet, S. Duzellier, 2000 .

Influence of solar cycle on SPOT-1,-2,-3 upset rates

Robert Ecoffet, S. Duzellier, D. Falguere, 1995 .

Comparison between ground tests and flight data for two static 32 KB memories

Robert Ecoffet, P. Cheynet, S. Duzellier, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).