Philippe Dreux

Embedded high-precision frequency-based capacitor measurement system

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2013, 2013 IEEE 19th International On-Line Testing Symposium (IOLTS).

Accurate multiplexed test structure for threshold voltage matching evaluation

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2014, 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Dynamic current reduction of CMOS digital circuits through design and process optimization

Jean Michel Portal, Nicolas Borrel, Pascal Masson, 2015, 2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS).

Embedded high-precision capacitor measurement system based on ring-oscillator

Hassen Aziza, Philippe Dreux, Jean-Michel Portal, 2015 .

Improvement of MOSFET matching characterization with calibrated multiplexed test structure

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2015, Microelectron. Reliab..

An innovative standard cells remapping method for in-circuit critical parameters monitoring

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS).