Yu Zongguang

W-plug via electromigration in CMOS process

Xiao Zhiqiang, Zhao Wenbin, Cheng Haifeng, 2009 .

Effects of TID radiation on P+ ion-implanted HVNMOS devices

Xiao Zhiqiang, Yu Zongguang, Liu Guozhu, 2020 .

The generation and influence of trapped charges in FLOTOX EEPROM tunnel oxide under various erase/write conditions

Yu Zongguang, Xu Zheng, Ye Shouyin, 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105).

Effect of phosphorus ion implantation on back gate effect of partially depleted SOI NMOS under total dose radiation

Yu Zongguang, Li Leilei, Zhou Xinjie, 2015 .

Characterization and Modeling of a Highly Reliable ONO Antifuse for High-Performance FPGA and PROM

Yu Zongguang, Liu Guozhu, W. Jianwei, 2016 .

Energy capability enhancement for isolated extended drain NMOS transistors

M. XiaoHui, Yu Zongguang, Nie Weidong, 2012 .

Total ionizing dose radiation hardening technology based on double-charge multiple-step ion implantation

Yu Zongguang, W. Jianwei, Hong Genshen, 2023, Microelectronics Reliability.