M. Kraatz

发表

A. V. Vairagar, P. Ho, G. Schneider, 2009, IEEE Transactions on Device and Materials Reliability.

J. Im, P. Ho, E. Zschech, 2010, 2010 IEEE International Interconnect Technology Conference.

Ehrenfried Zschech, Martin Gall, André Clausner, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).