R. Allen
发表
R. Allen,
M. Cresswell,
L. M. Buck,
1992,
IEEE Electron Device Letters.
L. W. Linholm,
R. Ghoshtagore,
W. Guthrie,
1999
.
L. W. Linholm,
C. E. Murabito,
W. Guthrie,
2002,
Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..
Jon Geist,
C. McGray,
J. Geist,
2014,
Dog Whistles, Walk-Backs, and Washington Handshakes.
Ndubuisi G. Orji,
Richard A. Allen,
Michael W. Cresswell,
2007,
SPIE Advanced Lithography.
C. McGray,
J. Geist,
R. Allen,
2011
.
Ndubuisi G. Orji,
Richard A. Allen,
James E. Potzick,
2007,
SPIE Photomask Technology.
C. McGray,
J. Geist,
R. Dixson,
2012
.
Richard A. Allen,
Mona E. Zaghloul,
Harry A. Schafft,
2009,
Microelectron. Reliab..
A. J. Snell,
S. Smith,
J. Stevenson,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
M. Zaghloul,
D. Blackburn,
H. Schafft,
2006
.
K. Hummler,
R. Allen,
V. Vartanian,
2014
.
T. LeBrun,
J. Gorman,
D. Long,
2021,
2021 Conference on Lasers and Electro-Optics (CLEO).
F. Zhou,
J. Gorman,
D. Long,
2021,
Optics express.
T. LeBrun,
J. Gorman,
D. Long,
2020
.
T. LeBrun,
J. Gorman,
D. Long,
2021,
2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC).
T. LeBrun,
J. Gorman,
D. Long,
2020,
2020 IEEE Photonics Conference (IPC).
Ravi Kiran Attota,
Benjamin Bunday,
Richard Allen,
2018,
Measurement science & technology.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1998,
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
Li Shi,
Bin Li,
Zhiquan Luo,
2009,
Nanotechnology.
T. Germer,
M. Bishop,
R. Dixson,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
Richard A. Allen,
Heather Patrick,
Ronald G. Dixson,
2007
.
Loren W. Linholm,
M. W. Cresswell,
R. A. Allen,
1999,
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
Richard A. Allen,
Ronald G. Dixson,
Michael W. Cresswell,
2006,
Journal of research of the National Institute of Standards and Technology.
Bin Li,
Kuan Lu,
Rui Huang,
2008,
Nano letters.
Richard A. Allen,
Mona E. Zaghloul,
Harry A. Schafft,
2006,
Microelectron. Reliab..
Richard A. Allen,
Michael Gaitan,
Jon Geist,
2021,
2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT).
Richard A. Allen,
Ronald G. Dixson,
Michael W. Cresswell,
2005
.
A. Walton,
A. Bunting,
R. Dixson,
2007
.
M. W. Cresswell,
R. A. Allen,
A. Hunt,
2005,
SPIE Advanced Lithography.
M. Lahti,
N.M.P. Guillaume,
L. W. Linholm,
2004,
IEEE Transactions on Semiconductor Manufacturing.
J. Im,
Rui Huang,
P. Ho,
2009
.
Richard A. Allen,
Anthony J. Walton,
J.T.M. Stevenson,
2007
.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
Ndubuisi G. Orji,
Richard A. Allen,
Ronald G. Dixson,
2016
.
Richard A. Allen,
Mona E. Zaghloul,
Michael W. Cresswell,
2004,
IEEE Transactions on Instrumentation and Measurement.
M. Buehler,
R. Allen,
Cesar A. Pifia,
1988
.
Richard A. Allen,
Zoltan Kiss,
Gyorgy Nadudvari,
2014
.
P. Ho,
Li Shi,
R. Allen,
2009,
Nanotechnology.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
Richard A. Allen,
John E. Bonevich,
Michael W. Cresswell,
2000,
Advanced Lithography.
Richard A. Allen,
Michael W. Cresswell,
Jeffry J. Sniegowski,
1998,
Advanced Lithography.
L.W. Linholm,
R.A. Allen,
M.W. Cresswell,
1997,
IEEE Transactions on Semiconductor Manufacturing.