W. E. Lee

Extraction of sheet resistance from four-terminal sheet resistors replicated in monocrystalline films with nonplanar geometries

L. W. Linholm, R. Ghoshtagore, W. Guthrie, 1999 .

Reference-length shortening by Kelvin voltage taps in linewidth test structures replicated in monocrystalline silicon films

Jeffry J. Sniegowski, M. W. Cresswell, R. A. Allen, 1997, 1997 IEEE International Conference on Microelectronic Test Structures Proceedings.

Mechanical failure strength characterization of silicon dice

John H. L. Pang, W. E. Lee, T. H. Low, 2003, Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003).

Microstructural changes in Beta-silicon nitride grains upon crystallizing the grain-boundary glass

G. Hilmas, W. E. Lee, W. E. Lee, 1989 .