M. Yamaguchi

Three-dimensional displacement measurement of a tube scanner for a scanning tunneling microscope by optical interferometer

T. Fujii, K. Nakayama, M. Suzuki, 1995 .

High Frequency Transmission Property Evaluation of Fine Wiring Substrates

Satoru Kuramochi, Yoshitaka Fukuoka, M. Yamaguchi, 2008 .

Micropattern measurement with an atomic force microscope

T. Fujii, M. Miyashita, K. Nakayama, 1991 .

Computer simulation study on the shear-induced phase separation in semidilute polymer solutions in 3-dimensional space

T. Taniguchi, T. Hashimoto, M. Yamaguchi, 2006 .

Scanning tunneling microscope with three‐dimensional interferometer for surface roughness measurement

T. Fujii, M. Suzuki, M. Yamaguchi, 1995 .