Moritz Fieback

发表

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

Said Hamdioui, Mottaqiallah Taouil, Lizhou Wu, 2020, 2020 IEEE European Test Symposium (ETS).

Testing Computation-in-Memory Architectures Based on Emerging Memories

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2019, 2019 IEEE International Test Conference (ITC).

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Testing Scouting Logic-Based Computation-in-Memory Architectures

Said Hamdioui, Mottaqiallah Taouil, Rajendra Bishnoi, 2020, 2020 IEEE European Test Symposium (ETS).

Testing Resistive Memories: Where are We and What is Missing?

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2018, 2018 IEEE International Test Conference (ITC).

Rebooting Computing: The Challenges for Test and Reliability

Ian O'Connor, Elena I. Vatajelu, Giorgio Di Natale, 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2019, 2019 IEEE European Test Symposium (ETS).

Ionizing radiation modeling in DRAM transistors

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2018, 2018 IEEE 19th Latin-American Test Symposium (LATS).

Defect and Fault Modeling Framework for STT-MRAM Testing

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2021, IEEE Transactions on Emerging Topics in Computing.

Device-Aware Test: A New Test Approach Towards DPPB Level

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE International Test Conference (ITC).

Special Session – Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

Ying Wang, Said Hamdioui, Rajendra Bishnoi, 2020, 2020 IEEE 38th VLSI Test Symposium (VTS).

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

Said Hamdioui, Mottaqiallah Taouil, Hassen Aziza, 2020, IEEE Access.

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Said Hamdioui, Stephan Menzel, Letícia Maria Veiras Bolzani, 2021, Journal of Electronic Testing.

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

Said Hamdioui, Mottaqiallah Taouil, Hassen Aziza, 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State

Arnaud Virazel, Patrick Girard, Said Hamdioui, 2021, Electronics.

Improving the Detection of Undefined State Faults in FinFET SRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Leticia Bolzani Poehls, 2021, 2021 IEEE European Test Symposium (ETS).

Hard-to-Detect Fault Analysis in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Lizhou Wu, 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Evaluating the Impact of Process Variation on RRAMs

Fabian Vargas, Said Hamdioui, Letícia Maria Veiras Bolzani, 2021, 2021 IEEE 22nd Latin American Test Symposium (LATS).

Intermittent Undefined State Fault in RRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 IEEE European Test Symposium (ETS).