M. Furchi

发表

T. Mueller, A. Pospischil, M. Furchi, 2013, Nature Nanotechnology.

F. Libisch, T. Mueller, J. Burgdörfer, 2014, Nano letters.

T. Fromherz, T. Mueller, A. Pospischil, 2013, 1302.3854.

P. Klang, G. Strasser, K. Unterrainer, 2011, Nano letters.

Tibor Grasser, Thomas Mueller, Dmitry K. Polyushkin, 2017 .

T. Mueller, A. Pospischil, M. Furchi, 2017, IEEE Journal of Selected Topics in Quantum Electronics.

T. Grasser, B. Stampfer, M. Waltl, 2018, IEEE Journal of the Electron Devices Society.

Thomas Mueller, T. Mueller, A. Pospischil, 2014, Nano letters.

T. Mueller, A. Pospischil, M. Furchi, 2014, 2014 IEEE International Electron Devices Meeting.

T. Mueller, A. Pospischil, M. Furchi, 2014, 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications.

T. Mueller, A. Pospischil, M. Furchi, 2014, Nano letters.

T. Mueller, A. Pospischil, M. Furchi, 2014, 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications.

T. Fromherz, T. Mueller, A. Pospischil, 2013, CLEO: 2013.

P. Klang, G. Strasser, K. Unterrainer, 2012, 2012 Conference on Lasers and Electro-Optics (CLEO).

T. Fromherz, T. Mueller, A. Pospischil, 2013, Nature Photonics.

F. Libisch, T. Mueller, J. Burgdörfer, 2014, Nano letters.

T. Mueller, A. Pospischil, M. Furchi, 2013, Nature nanotechnology.

P. Klang, G. Strasser, K. Unterrainer, 2011, Nano letters.

S. Schuler, T. Mueller, A. Pospischil, 2015, 2015 Conference on Lasers and Electro-Optics (CLEO).

E. Bertagnolli, T. Mueller, A. Pospischil, 2014 .

T. Mueller, M. Furchi, D. Polyushkin, 2018, Nature Communications.

Alexander Urich, Karl Unterrainer, Thomas Mueller, 2012 .

Alexander Urich, Thomas Mueller, Marco Furchi, 2013, Photonics West - Lasers and Applications in Science and Engineering.

S. Schuler, T. Mueller, M. Furchi, 2018, npj 2D Materials and Applications.

Tibor Grasser, Michael Waltl, T. Mueller, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

T. Grasser, M. Waltl, T. Mueller, 2016, IEEE International Reliability Physics Symposium.