David Nečas

发表

Rough surface scattering simulations using graphics cards

Petr Klapetek, Miroslav Valtr, Ales Poruba, 2010 .

Gwyscan: a library to support non-equidistant scanning probe microscope measurements

Petr Klapetek, Miroslav Valtr, David Nečas, 2017 .

Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range

Angelo Giglia, David Nečas, Daniel Franta, 2016, SPIE Photonics Europe.

Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method

Petr Klapetek, David Nečas, Olga Kazakova, 2019, Scientific Reports.

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

Pavel Nádaský, Ivan Ohlidal, David Nečas, 2015, SPIE Optical Systems Design.

Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry

David Nečas, Daniel Franta, Jiří Vodák, 2015, SPIE Optical Systems Design.

Dispersion model for optical thin films applicable in wide spectral range

Angelo Giglia, David Nečas, Daniel Franta, 2015, SPIE Optical Systems Design.

Basic Data Processing

David Nečas, D. Nečas, 2013 .

Wide spectral range characterization of antireflective coatings and their optimization

David Nečas, Daniel Franta, Ivan Ohlídal, 2015, SPIE Optical Systems Design.

Data Processing Methods for Imaging Spectrophotometry

David Nečas, D. Nečas, 2018 .

Optical characterization of HfO2 thin films

Pavel Pokorný, David Nečas, Daniel Franta, 2011 .

Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models

David Nečas, Daniel Franta, Lenka Zajíčková, 2013 .

Search For Correlations Between Batse Gamma-Ray Bursts and Supernovae

Graziella Pizzichini, Rene Hudec, Jiri Polcar, 2005 .

Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia.

David Nečas, Daniel Franta, Ivan Ohlídal, 2015, Applied optics.

Methods for determining and processing 3D errors and uncertainties for AFM data analysis

Petr Klapetek, Ludger Koenders, David Nečas, 2011 .

Lubricant Rupture Ratio at Elastohydrodynamically Lubricated Contact Outlet

Martin Hartl, David Nečas, Ivan Křupka, 2015, Tribology Letters.

Ellipsometric characterization of inhomogeneous non‐stoichiometric silicon nitride films

David Nečas, Daniel Franta, Ivan Ohlídal, 2013 .

Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films

David Nečas, Daniel Franta, Ivan Ohlídal, 2011 .