K. Sekine
发表
T. Ohmi,
Y. Saito,
M. Hirayama,
2000
.
T. Ohmi,
M. Hirayama,
K. Sekine,
1999
.
Y. Tsunashima,
T. Yamamoto,
H. Ishiuchi,
2002,
Digest. International Electron Devices Meeting,.
N. Yasuda,
K. Sekine,
S. Fujii,
2010,
2010 IEEE International Reliability Physics Symposium.
R. Kaihara,
T. Ohmi,
S. Sugawa,
2010,
IEEE Transactions on Semiconductor Manufacturing.
S. Onoue,
K. Sekine,
R. Fujitsuka,
2016
.
M. Sato,
J. Koga,
Y. Tsuchiya,
2006,
2006 International Electron Devices Meeting.
T. Ohmi,
Y. Saito,
M. Hirayama,
2001
.
M. Takayanagi,
K. Eguchi,
I. Hirano,
2004
.
T. Shibata,
T. Ohmi,
K. Sekine,
1998
.
Y. Tsunashima,
M. Takayanagi,
M. Sato,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
M. Takayanagi,
K. Eguchi,
I. Hirano,
2012
.
T. Ohmi,
M. Hirayama,
K. Sekine,
1999
.
M. Hirayama,
K. Sekine,
T. Ohmi,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
J. Koga,
A. Nishiyama,
Y. Tsuchiya,
2008
.
T. Ohmi,
Y. Saito,
M. Hirayama,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
Masakazu Goto,
Kikuo Yamabe,
Yuichiro Mitani,
2013,
Microelectron. Reliab..
Y. Tsunashima,
M. Sato,
K. Eguchi,
2007,
IEEE Transactions on Electron Devices.
T. Ohmi,
K. Sekine,
Yuji Saito,
1997
.
Y. Mitani,
I. Hirano,
K. Sekine,
2009,
IEEE Transactions on Device and Materials Reliability.
Yoshitaka Tsunashima,
Kazuhiro Eguchi,
Katsuyuki Sekine,
2005
.
K. Sekine,
S. Inumiya,
Y. Tsunashima,
2003,
IEEE International Electron Devices Meeting 2003.