Jonghan Jin

发表

A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices

Jungjae Park, Heulbi Ahn, Jaeseok Bae, 2018, Scientific Reports.

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2018 .

A wide-range optical frequency generator based on the frequency comb of a femtosecond laser.

Young-Jin Kim, Sangwon Hyun, Jonghan Jin, 2008, Optics express.

Absolute length measurement with the frequency comb of a femtosecond laser

Young-Jin Kim, Sangwon Hyun, Jonghan Jin, 2009 .

A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry

Jong-Ahn Kim, Heulbi Ahn, Jaeseok Bae, 2019, International Journal of Precision Engineering and Manufacturing.

Absolute Distance Measurements Using the Optical Comb of a Femtosecond Pulse Laser

Young-Jin Kim, Jonghan Jin, Seung-Woo Kim, 2007 .

Pitch Measurement of 150 ㎚ 1D-grating Standards Using an Nano-metrological Atomic Force Microscope

S. Gonda, T. Kurosawa, Jonghan Jin, 2004 .

Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder.

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2011, The Review of scientific instruments.

On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2020 .

An interferometric calibration system for various linear artefacts using active compensation of angular motion errors

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2011 .

Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range.

Jonghan Jin, Jungjae Park, Hiroki Mori, 2019, Optics express.

Precise measurement of the thickness of silicon wafers by double-sided interferometer and bilateral comparison

Y. Bitou, Jaeseok Bae, Jonghan Jin, 2021 .

An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes.

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2017, The Review of scientific instruments.

Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry

Jong-Ahn Kim, Jaeseok Bae, Jonghan Jin, 2019, Optics Communications.

An interferometric method for simultaneous measurement of thickness, refractive index, and surface profile of a silicon wafer

Jaeseok Bae, Jonghan Jin, Jungjae Park, 2022, Optical Engineering + Applications.

Vibration-insensitive measurements of the thickness profile of large glass panels.

Jong-Ahn Kim, Jae Wan Kim, Jaeseok Bae, 2015, Optics express.

Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers.

Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, 2014, Optics express.

Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, 2013 .