D. Knorr

发表

Effects of material condition on the iodine SCC susceptibility of zircaloy-2 cladding

R. Pelloux, D. Knorr, L. V. Swam, 1982 .

Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films

Ann N. Campbell, D. B. Knorr, R. E. Mikawa, 1993 .

On the effect of processing parameters in the chemical‐vapor deposition of YBa2Cu3O7−δ thin films on polycrystalline silver

A. Kaloyeros, M. Walker, C. Maggiore, 1993 .

The effect of aging on microstructure, room temperature deformation, and fracture of Sn-Bi/Cu solder joints

D. B. Knorr, L. E. Felton, L. Felton, 1994 .

Texture and Microstructure Effects on Electromigration Behavior of Aluminum Metallization

K. Rodbell, D. Knorr, D. Tracy, 1991 .

Stresses in Thin Film Multilayer Interconnect Structures

D. Knorr, S. Bruck, 1992 .

Mechanical aspects of multichip module reliability

D. Knorr, 1992 .

Effects of texture and microstructure on the propagation of iodine stress corrosion cracks in zircaloy

R. Pelloux, D. Knorr, 1982 .

Pb-free Soldering Alternatives For Fine Pitched Electronics Packaging

L. Felton, D. Knorr, C. Raeder, 1992, Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium.

Modeling the texture dependence of environmentally assisted growth of long and short cracks

D. Knorr, 1988 .

The Evolution of the Segregation Behavior of Alloying Elements in a Low-Alloy Steel

David B. Williams, A. Papworth, D. Knorr, 2003 .

Effects of Deposition Conditions onTexture in Copper ThinFilms on Si (111)

T. Lu, D. Knorr, 1991 .

Correlation between special grain boundaries and electromigration behavior of aluminum thin films

K. Rodbell, J. Szpunar, D. Knorr, 1995 .

TEXTURE OF VAPOR DEPOSITED PARYLENE THIN FILMS

J. McDonald, T. Lu, G-R. Yang, 1994 .

High‐frequency response of capacitors fabricated from fine grain BaTiO3 thin films

E. J. Rymaszewski, T. Lu, J. Borrego, 1995 .

Texture Evolution During Grain Growth of Aluminum Films

Toh-Ming Lu, D. B. Knorr, T. Lu, 1990 .

Texture analysis of Al/SiO2 films deposited by a partially ionized beam

T. Lu, D. Knorr, 1989 .

Crystallographic texture change during abnormal grain growth in Cu‐Co thin films

C. Cabral, J. Gupta, J. Harper, 1994 .

Texture in multilayer metallization structures

D. B. Knorr, Kenneth P. Rodbell, K. Rodbell, 1994 .

Applications of texture in thin films

J. Szpunar, D. Knorr, 1994 .

Effect of Line Width on Electromigration of Textured Pure Aluminum Films

K. Rodbell, D. Knorr, 1993 .

The role of texture on the reliability of Aluminum-based interconnects

D. Knorr, 1993 .

Texture Development in Thin Metallic Films

T. Lu, D. Knorr, D. Tracy, 1991 .

Texture and microstructure of thin copper films

D. B. Knorr, D. Knorr, D. P. Tracy, 1993 .

Applying texture analysis to materials engineering problems

H. Weiland, J. Szpunar, D. Knorr, 1994 .

The properties of tin-bismuth alloy solders

L. Felton, D. Knorr, C. Raeder, 1993 .

Through-thickness characterization of copper electrodeposit

H. D. Merchant, D. Knorr, R. J. Angelis, 1995 .

Unusual orientation relationship for a copper film on Si(111)

T. Lu, D. Knorr, P. Bai, 1990 .

Texture analysis of magnetically aligned RBa2Cu3O7-x by the pole figure technique

J. Livingston, D. Knorr, 1989 .

Deposition of amorphous BaTiO3 optical films at low temperature

S. T. Lakshmikumar, T. Lu, D. Knorr, 1993 .

Morphology and composition of second phase particles in zircaloy-2

P. Chemelle, J. B. Sande, R. Pelloux, 1983 .

Overview no. 84: An analysis of diffusion and diffusional creep in stoichiometric and hyperstoichiometric uranium dioxide

R. M. Cannon, D. Knorr, R. Coble, 1989 .

Stability of YBa2Cu3O7‐x in Molten Chloride Salts

D. Knorr, C. Raeder, 1990 .

Stability of Yttrium Barium Cuprate in Molten Salts

D. Knorr, C. Raeder, 1990 .

Effects of heat treatment on microstructure and texture in Ti24at%Al-11at%Nb

N. Stoloff, D. Knorr, 1990 .

Room-temperature epitaxy of Cu on Si(111) using partially ionized beam deposition

T. Lu, G-R. Yang, D. Knorr, 1990 .

Quantitative characterization of crystallographic textures in zirconium alloys

R. Pelloux, D. Knorr, 1977 .

Deformation mechanism mapping of α-Zr and zircaloy-2

M. Notis, D. Knorr, 1975 .

Microstructural evolution and mechanical properties of Sn-Bi based solders

D. B. Knorr, L. E. Felton, L. Felton, 1993, Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium.

Isothermal creep of eutectic SnBi and SnAg solder and solder joints

D. B. Knorr, R. W. Messler, R. Messler, 1994, Proceedings of 16th IEEE/CPMT International Electronic Manufacturing Technology Symposium.

The microstructure, mechanical stress, texture, and electromigration behavior of Al-Pd alloys

D. B. Knorr, Kenneth P. Rodbell, J. D. Mis, 1993 .

Correlation of texture with electromigration behavior in Al metallization

D. B. Knorr, Kenneth P. Rodbell, K. Rodbell, 1991 .

Relationship between contractile strain ratioR and texture in zirconium alloy tubing

R. Pelloux, D. Knorr, L. F. P. Swam, 1979 .

Model for predicting thermal stresses in thin polycrystalline films

A. Maniatty, D. Knorr, Jiun-Shya Yu, 1997 .

A review of microstructure in vapor deposited copper thin films

D. Knorr, D. Tracy, 1995 .

The role of texture in the electromigration behavior of pure aluminum lines

D. B. Knorr, Kenneth P. Rodbell, K. Rodbell, 1996 .

Thermally stable amorphous BaxTi2−xOy thin films

Toh-Ming Lu, E. J. Rymaszewski, D. B. Knorr, 1995 .

Development of texture in interconnect thin film stacks

S. Merchant, D. Knorr, M. Biberger, 1998 .

The Effect of Collimation On Sputtered Alcusi and Almg Microstructures And Electromigration Failure Characteristics

J. G. Ryan, T. Sullivan, D. Knorr, 1993 .

Effects of Film Texture on Electromigration Lifetime Predictions

D. B. Knorr, K. Rodbell, D. Knorr, 1992 .

Frequency domain (1 kHz-40 GHz) characterisation of thin films for multichip module packaging technology

Xiang Zhang, Xiaowei Wu, J. F. McDonald, 1994 .

Textures in Thin Films

D. B. Knorr, D. Knorr, 1994 .

Low-temperature fabrication of amorphous BaTiO/sub 3/ thin-film bypass capacitors

E. J. Rymaszewski, S. T. Lakshmikumar, T. Lu, 1993, IEEE Electron Device Letters.

Local Texture and Electromigration in Fine Line Microelectronic Aluminum Metallization

J. L. Hurd, K. Rodbell, D. Knorr, 1994 .

Discrete β-Ta2O5 crystallite formation in reactively sputtered amorphous thin films

E. J. Rymaszewski, T. Lu, D. Knorr, 1998 .

The multichip module as a board-level package

D. B. Knorr, D. Knorr, 1995 .