K. Croes
发表
Diana Tsvetanova,
Wonsub Kim,
Kevin Garello,
2018,
2018 IEEE Symposium on VLSI Circuits.
W. De Ceuninck,
L. De Schepper,
K. Croes,
1998
.
E. Beyne,
K. Croes,
P. Jaenen,
2012,
2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT).
W. De Ceuninck,
L. De Schepper,
K. Croes,
2001
.
Susanne Hübner,
Christian Boit,
K. Croes,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
P. Raghavan,
K. Croes,
P. Debacker,
2016,
2016 IEEE Symposium on VLSI Technology.
K. Croes,
Y. Barbarin,
Ph Roussel,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects
K. Croes,
S. Demuynck,
C. Wu,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
N. Horiguchi,
K. Croes,
S. Demuynck,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Guido Groeseneken,
W. De Ceuninck,
L. De Schepper,
1999
.
K. Croes,
M. Stucchi,
V. Cherman,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
Y. Barbarin,
Z. Tokei,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
E. Beyne,
K. Croes,
A. Redolfi,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
K. Croes,
M. Pantouvaki,
G. Beyer,
2011,
2011 International Reliability Physics Symposium.
K. Croes,
S. Demuynck,
T. Kauerauf,
2014,
IEEE International Interconnect Technology Conference.
E. Beyne,
G. Van der Plas,
I. De Wolf,
2012,
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. Degraeve,
K. Croes,
Y. Barbarin,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
S. Decoster,
K. Croes,
I. Ciofi,
2018,
2018 IEEE International Interconnect Technology Conference (IITC).
K. Croes,
S. Demuynck,
I. Ciofi,
2014,
IEEE International Interconnect Technology Conference.
E. Beyne,
I. De Wolf,
K. Croes,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
M. Stucchi,
T. Kauerauf,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
K. Croes,
Y. Barbarin,
Z. Tokei,
2012,
2012 IEEE International Interconnect Technology Conference.
I. De Wolf,
K. Croes,
Y. Li,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
S. Decoster,
J. Ryckaert,
K. Croes,
2017,
2017 IEEE International Interconnect Technology Conference (IITC).
I. De Wolf,
Ivan Ciofi,
K. Croes,
2015
.
K. Croes,
H. Zahedmanesh,
O. Varela Pedreira,
2018,
2018 IEEE International Interconnect Technology Conference (IITC).
I. De Wolf,
Ivan Ciofi,
Y Yohan Barbarin,
2013
.
K. Croes,
M. Lofrano,
S. Demuynck,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Geert Molenberghs,
W. De Ceuninck,
L. De Schepper,
1998
.
J. De Coster,
S. Balakrishnan,
K. Croes,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
K. Croes,
C.J. Wilson,
M. Stucchi,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
I. De Wolf,
Ivan Ciofi,
K. Croes,
2015
.
E. Beyne,
I. De Wolf,
K. Croes,
2013,
2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
E. Beyne,
K. Croes,
G. Groeseneken,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
M. Lofrano,
C.J. Wilson,
2011,
2011 International Reliability Physics Symposium.
C. Boit,
I. De Wolf,
F. Altmann,
2019,
Microelectronics Reliability.
E. Beyne,
G. Van der Plas,
I. De Wolf,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
K. Croes,
S. Demuynck,
Marleen H. van der Veen,
2015,
2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).
C. Boit,
T. Nakamura,
K. Croes,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).