J. Savir

发表

Redundancy revisited [CMOS combinational circuits]

J. Savir, 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).

The Weighted Syndrome Sums Approach to VLSI Testing

George Markowsky, Jacob Savir, Merlin G. Smith, 1981, IEEE Transactions on Computers.

Testing for Coupled Cells in Random-Access Memories

Salvatore R. Vecchio, J. Savir, W. McAnney, 1989, ITC.

On broad-side delay test

Srinivas Patil, Jacob Savir, S. Patil, 1994, Proceedings of IEEE VLSI Test Symposium.

Scan-based transition test

Srinivas Patil, Jacob Savir, S. Patil, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Built In Test for VLSI: Pseudorandom Techniques

Jacob Savir, Paul H. Bardell, William H. McAnney, 1987 .

Test limitations of parametric faults in analog circuits

Zhen Guo, Jacob Savir, J. Savir, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits

Jacob Savir, J. Savir, 1981, IEEE Transactions on Computers.

VLSI Self-Testing Based on Syndrome Techniques

George Markowsky, Jacob Savir, Merlin G. Smith, 1981, ITC.

Syndrome-Testable Design of Combinational Circuits

Jacob Savir, J. Savir, 1980, IEEE Transactions on Computers.

Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection

Jacob Savir, J. Savir, 1980, IEEE Transactions on Computers.

Good Controllability and Observability Do Not Guarantee Good Testability

Jacob Savir, J. Savir, 1983, IEEE Transactions on Computers.

Random Pattern Testability

Gary S. Ditlow, Jacob Savir, Paul H. Bardell, 1984, IEEE Transactions on Computers.

PREANALYSIS FOR THE FULL RANGE CUTTING ALGORITHM.

V. Gupta, Jacob Savir, J. Savir, 1984 .

Detection of Single Intermittent Faults in Sequential Circuits

Jacob Savir, J. Savir, 1980, IEEE Transactions on Computers.

Detection of intermittent faults in sequential circuits

Jacob Savir, J. Savir, 1978 .

Why partial design verification works better than it should

Jacob Savir, J. Savir, 1988, 25th ACM/IEEE, Design Automation Conference.Proceedings 1988..

Skewed-Load Transition Test: Part II, Coverage

Srinivas Patil, Jacob Savir, S. Patil, 1992, Proceedings International Test Conference 1992.

Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths

Hideo Fujiwara, Michiko Inoue, Jacob Savir, 2005, IEICE Trans. Inf. Syst..

Power-constrained DFT algorithms for non-scan BIST-able RTL data paths

Hideo Fujiwara, Michiko Inoue, Jacob Savir, 2004, 13th Asian Test Symposium.

Random pattern testability of memory control logic

Jacob Savir, J. Savir, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

On Random Pattern Test Length

Jacob Savir, Paul H. Bardell, P. Bardell, 1984, IEEE Transactions on Computers.

Built-In Self-Test: Milestones and Challenges

Jacob Savir, Paul H. Bardell, P. Bardell, 1993, VLSI Design.

On the tradeoff between number of clocks and number of latches in shift registers

Jacob Savir, J. Savir, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Scan latch design for delay test

Jacob Savir, J. Savir, 1997, Proceedings International Test Conference 1997.

Reduced Latch Count Shift Registers

Jacob Savir, J. Savir, 1997, J. Electron. Test..

Salvaging test windows in BIST diagnostics

Jacob Savir, J. Savir, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

Module Level Weighted Random Patterns

Jacob Savir, J. Savir, 1995, Proceedings of the Fourth Asian Test Symposium.

Testing forSingle Intermittent Failures inCombinational Circuits byMaximizing theProbability ofFault Detection

Jacob Savir, J. Savir, 1980 .

Developments in delay testing

Jacob Savir, J. Savir, 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

Skewed-Load Transition Test: Part I, Calculus

Jacob Savir, J. Savir, 1992, Proceedings International Test Conference 1992.

On broad-side delay testing

J. Savir, J. Savir, 1994 .