U. Sparmann

Hit { a Hierarchical Environment for Interactive Test Engineering Hit { a Hierarchical Environment for Interactive Test Engineering

J. Hartmann, G. Hotz, M. Krallmann, 1994 .

Local Transformations and Robust Dependent Path Delay

Bernd Becker, Uwe Sparmann, Sudhakar M. Reddy, 1996 .

A uniform test approach for RCC-adders

Bernd Becker, Uwe Sparmann, B. Becker, 1991, Fundamenta Informaticae.

A hierarchical environment for interactive test engineering

Sudhakar M. Reddy, Uwe Sparmann, Günter Hotz, 1994, Proceedings., International Test Conference.

Derivation of high quality tests for large heterogeneous circuits: floating-point operations

Uwe Sparmann, U. Sparmann, 1992, [1992] Proceedings The European Conference on Design Automation.

On minimizing the number of test points needed to achieve complete robust path delay fault testability

Irith Pomeranz, Uwe Sparmann, Prasanti Uppaluri, 1996, Proceedings of 14th VLSI Test Symposium.

On the testability of iterative logic arrays

Bernd Becker, Uwe Sparmann, Joachim Hartmann, 1995, Integr..

Computations over finite monoids and their test complexity

Bernd Becker, Uwe Sparmann, B. Becker, 1989, [1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.

THE IMPORTANCE OF LANE-CHANGING ON MOTORWAYS

U Sparmann, U. Sparmann, 1979 .

On the check base selection problem for fast adders

Uwe Sparmann, U. Sparmann, 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

Fast Identification of Robust Dependent Path Delay Faults

Sudhakar M. Reddy, Kwang-Ting Cheng, Uwe Sparmann, 1995, 32nd Design Automation Conference.