Jens Illemann

Topography measurement of nanometer synchrotron optics

Ralf D. Geckeler, Jens Illemann, Ingolf Weingartner, 2002, SPIE Optics + Photonics.

Absolute deflectometric measurement of topography: influence of systematic deviations

Andreas Just, Jens Illemann, 2004, SPIE Photonics Europe.

ISO test survey on material influence in dimensional computed tomography

Markus Bartscher, Jens Illemann, Ulrich Neuschaefer-Rube, 2016 .

High-accuracy form measurement of large optical surfaces

Ralf D. Geckeler, Jens Illemann, Michael Schulz, 2003, SPIE Optics + Photonics.

Absolute high-accuracy deflectometric measurement of topography

Jens Illemann, 2003, SPIE Optics + Photonics.

Qualification and testing of CT systems

Markus Bartscher, Simone Carmignato, Jens Illemann, 2018 .

Procedure and reference standard to determine the structural resolution in coordinate metrology

Frank Härtig, Otto Jusko, Markus Bartscher, 2014 .

Deflectometric Measurements of Synchrotron-Optics for Postprocessing

Matthias Wurm, Jens Illemann, 2004 .