P. Heide

发表

X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface

P. Heide, Q. Jiang, Y. Kim, 2001 .

Supermontaging: Reconstructing Large Cellular Volumes by Stitching Together Laterally Adjacent Tomograms

D. Mastronarde, B. Marsh, G. Morgan, 2008, Microscopy and Microanalysis.

Atom Probe Tomography and Microscopy 2020

W. Vandervorst, D. Larson, P. Heide, 2020 .

Surface analysis in the semiconductor industry: Present use and future possibilities

A. Franquet, T. Conard, W. Vandervorst, 2020, Surface and Interface Analysis.

Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy

P. Heide, 2008 .

The production of heavy multiply charged ions in secondary ion mass spectrometry

J. Metson, W. Lau, P. Heide, 1993 .

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs+ impact

P. Heide, 2006 .

Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs+

P. Heide, F. Azzarello, 2003 .

Transient effects in SIMS analysis of Si with Cs+ at high incidence angles: Secondary ion yield variations

P. Heide, 2002 .

Cesium-induced transient effects on the Si+ and Si− secondary ion emissions from Si and SiO2

P. Heide, 2000 .

Systematic x‐ray photoelectron spectroscopic study of La1−xSrx‐based perovskite‐type oxides

P. Heide, 2002 .

Differences between LaB6 and CeB6 by means of spectroscopic ellipsometry

R. D. Groot, P. Heide, A. Vroomen, 1986 .

Spectroscopic ellipsometry of Ni3Al in comparison with band-structure calculations

R. D. Groot, J. Buiting, P. Heide, 1985 .

Oxygen Transport in Oxide Thin Film Structures Oriented La0.5Sr0.5CoO3 − x on Single‐Crystal Yttria‐Stabilized Zirconia

S. Perry, C. Mims, A. Jacobson, 1999 .

Etching of thin SiO2 layers using wet HF gas

P. Heide, M. Hofman, H. Ronde, 1989 .

Characterization of porous titania glass: Raman, x‐ray diffraction and x‐ray photoelectron spectroscopic studies

P. Heide, R. Cooney, R. Howe, 1992 .

Optical second‐harmonic generation study of barium deposition on Si(001)

M. Krijn, P. Heide, R. Hollering, 1990 .

Micro-XRD characterization of a single copper filled through-silicon via

P. Heide, M. Faheem, Yifan Liang, 2015 .

A new precursor for the chemical vapor deposition of tantalum nitride films

Yongqiang Wang, P. Heide, D. M. Hoffman, 2004 .

Photoelectron binding energy shifts observed during oxidation of group IIA, IIIA and IVA elemental surfaces

P. Heide, 2006 .

Reconstruction of the secondary ion energy distributions of Sc−, Ti−, V−, Co−, Ni− and Cu− emitted from metal surfaces

P. Heide, 1995 .

Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15

D. Zhao, R. Czernuszewicz, P. Heide, 1999 .

Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates

P. Heide, 2001 .

Photoelectron spectroscopic study of the temperature-dependent termination of the LaAlO3(100) surface

P. Heide, J. Rabalais, 1998 .

Microscopic investigations of chemo-mechanical polishing of tungsten

D. C. Koeck, S. Perry, P. Heide, 2004 .

Stability studies of ultrashallow junction formed by low energy boron implant and spike annealing

L. Shao, Jiarui Liu, W. Chu, 2002 .

Titanium coordination in microporous and mesoporous oxide materials by monochromated X-ray photoelectron spectroscopy and X-ray Auger electron spectroscopy

S. Contarini, P. Heide, L. Kevan, 2002 .

Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

P. Heide, 2014 .

Influence of low level iron impurities on the initial interaction of water vapour with polycrystalline magnesium surfaces

N. McIntyre, P. Heide, T. Do, 1994 .

X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices

P. Heide, Paul Van der Heide, 2011 .

The oxidation kinetics of Mg-, Si- and Fe-implanted aluminum by using X-ray photoelectron spectroscopy

N. McIntyre, P. Heide, T. Do, 1999 .

An electrical conductivity relaxation study of La0.6Sr0.4Fe0.8Co0.2O3−δ

A. Jacobson, S. Adler, P. Heide, 2003 .

The Ba/Si(100)-2 × 1 interface: II. XPS, BIS and synchrotron PS studies of Schottky-barrier formation

K. Horn, P. Heide, J. Fuggle, 1992 .

The Ba/Si(100)-2 × 1 interface. I: XPS and XAES studies of silicide formation

P. Heide, J. Fuggle, P. Weijs, 1992 .

Secondary ion emission from Ti, V, Cu, Ag and Au surfaces under KeV Cs+ irradiation

P. Heide, 2005 .

Transient effects in ultra shallow depth profiling of silicon by secondary ion mass spectrometry

S. Perry, P. Heide, J. Rabalais, 2000 .

Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs+

P. Heide, 2004 .

A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs

S. Perry, J. Bennett, P. Heide, 2003 .

Surface Oxygen Exchange Kinetics and Oxygen Diffusion Rates in Ysz Single Crystals

Jiarui Liu, W. Chu, C. Mims, 1998 .

Optical properties of some half-metallic ferromagnets

R. D. Groot, P. Heide, K. Buschow, 1985 .

Secondary ion emission from polycrystalline Al under Cs + irradiation

P. Heide, 2004 .

Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs+ irradiation

P. Heide, 2004 .

Structural reordering and electrical activation of ion-implanted GaAs and InP due to laser annealing in a controlled atmosphere

G. Scamarcio, V. Spagnolo, D. Karpuzov, 1999 .

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings

R. Protz, T. Sham, K. Jones, 1998 .

Preliminary Study for Multiple Object Oriented Approaches Towards Automated Segmentation, 3d visualisation of Cell Tomography

Brad J. Marsh, P. van der Heide, B. Marsh, 2012 .

SIMS imaging of insulator surfaces

N. McIntyre, P. Heide, 1993 .

Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis

J. Metson, W. Lau, P. Heide, 1992 .

Identification of LEIS contributions observed in the ion kinetic energy distributions collected on a cameca IMS‐3f SIMS instrument

A. Pratt, P. Heide, K. Franzreb, 1998 .

A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates

P. Heide, 1996 .

The infinite velocity method: A new method for SIMS quantification

N. McIntyre, P. Heide, G. Mount, 1994 .

Variations in the value of the characteristic velocity of the Zr− secondary ion emissions across the oxide/metal interface

P. Heide, 1994 .

Comment on “The ‘infinite velocity method’: a means of concentration calibration in secondary ion mass spectrometry?”: [Surf. Sci. 429 (1999) 84]

P. Heide, 2000 .

Inverse velocities of sputtered monatomic ions: Systematics and quantification

James D. Brown, P. Heide, U. Södervall, 1997 .

Use of Zr− secondary ion energy distributions and factor analysis to construct chemical‐state depth profiles in SIMS

N. McIntyre, P. Heide, S. Splinter, 1995 .

Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method

N. McIntyre, A. Pratt, P. Heide, 1998 .

Application of the infinite velocity method for quantifying negative secondary ion emissions to multi‐layered samples

N. McIntyre, P. Heide, S. Ramamuthy, 1995 .

Inverse velocity trends in secondary ion mass spectrometry; a new method for quantification?

P. Heide, 1994 .

Secondary ion inverse velocity plots from a Cameca IMS-3f SIMS instrument

P. Heide, 1994 .

Velocity distributions of the negatively charged monatomic secondary ions of copper, silver and gold

P. Heide, 1999 .

Toward accurate composition analysis of GaN and AlGaN using atom probe tomography

W. Vandervorst, L. Arnoldi, P. Heide, 2018 .

Topographic Correction of 3D SIMS Images

N. McIntyre, P. Heide, A. H. Clarke, 1997 .

Implantation damage effect on boron annealing behavior using low-energy polyatomic ion implantation

Jiarui Liu, W. Chu, P. Heide, 2000 .

Factors affecting the retention of Cs+ primary ions in Si

P. Heide, J. Rabalais, A. Kutana, 2004 .

The caesium enhancement effect observed during SIMS ultra shallow depth profile analysis of SiO2 on Si

P. Heide, 2000 .

Linear electric field effect on the EPR spectrum of single crystals and powdered single crystals of Cs2ZnCl4:Cu2+

R. Beer, P. Heide, R. Merks, 1979 .