C. Boyaval

发表

Optimization of a microelectromechanical systems (MEMS) approach for miniaturized microcantilever-based RF microwave probes

G. Dambrine, J. Marzouk, S. Arscott, 2016 .

MEMS probes for on-wafer RF microwave characterization of future microelectronics: design, fabrication and characterization

G. Dambrine, J. Marzouk, S. Arscott, 2015 .

Gallium nitride approach for MEMS resonators with highly tunable piezo-amplified transducers

L. Buchaillot, Y. Cordier, D. Théron, 2011, 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems.

Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

G. Dambrine, D. Théron, K. Haddadi, 2018, 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO).

Operation of Near-Field Scanning Millimeter-wave Microscopy up to 67 GHz under Scanning Electron Microscopy Vision

G. Dambrine, D. Théron, K. Haddadi, 2020, 2020 IEEE/MTT-S International Microwave Symposium (IMS).

Towards Silicon-Nanowire-Structured Materials by the Intimate Mixing of Patterning the Solid State and Chemical Reactions

B. Legrand, P. Perrot, C. Boyaval, 2009 .

Transport Properties of Methyl-Terminated Germanane Microcrystallites

Matthew G. Panthani, A. Addad, B. Grandidier, 2022, Nanomaterials.

Molecular beam epitaxial growth of hexagonal boron nitride on Ni foils

X. Wallart, J. Avila, D. Vignaud, 2021 .

Molecular beam epitaxial growth of multilayer 2D-boron nitride on Ni substrates from borazine and plasma-activated nitrogen

X. Wallart, D. Deresmes, J. Avila, 2022, Nanotechnology.

Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization

G. Dambrine, D. Théron, K. Haddadi, 2021, Applied Sciences.

Towards high quality CVD graphene growth and transfer

J. Avila, M. Asensio, É. Galopin, 2015 .

A comparison of pad metallization in miniaturized microfabricated silicon microcantilever-based wafer probes for low contact force low skate on-wafer measurements

G. Dambrine, J. Marzouk, S. Arscott, 2021, Journal of Micromechanics and Microengineering.

Performances of the Negative Tone Resist AZnLOF 2020 for Nanotechnology Applications

B. Legrand, E. Algre, C. Boyaval, 2012, IEEE Transactions on Nanotechnology.

Integrated MEMS RF Probe for SEM Station—Pad Size and Parasitic Capacitance Reduction

K. Haddadi, T. Lasri, S. Arscott, 2015, IEEE Microwave and Wireless Components Letters.

Electron beam nanolithography in AZnLOF 2020

Lionel Buchaillot, Bernard Legrand, Marc Faucher, 2010 .

Imaging Nanomechanical Vibrations and Manipulating Parametric Mode Coupling via Scanning Microwave Microscopy.

S. Venkatachalam, T. Rabenimanana, C. Boyaval, 2024, Nano letters.

Fabrication of silicon nitride membrane nanoelectromechanical resonator

D. Théron, Hao Xu, P. Tilmant, 2023, Microelectronic Engineering.

Three-Dimensional TiO2 Film Deposited by ALD on Porous Metallic Scaffold for 3D Li-Ion Micro-Batteries: A Road towards Ultra-High Capacity Electrode

D. Pech, T. Brousse, Maxime Hallot, 2022, Journal of The Electrochemical Society.