A. Bourret

发表

Surface melting enhanced by curvature effects

G. Deutscher, R. Kofman, P. Cheyssac, 1994 .

Quantitative interfacial profiles in CdTe/Mn(Mg)Te heterostructures

J. Hartmann, J. Rouviere, A. Bourret, 1998 .

The low-angle [011] tilt boundary in germanium I. High-resolution structure determination

A. Bourret, J. Desseaux, 1979 .

Early stages of oxygen segregation and precipitation in silicon

D. Seidman, A. Bourret, J. Thibault-Desseaux, 1984 .

Transmission Electron Microscope Studies of O, C, N Precipitation in Crystalline Silicon

A. Bourret, 1985 .

Dislocations at atomic scale

A. Bourret, J. Desseaux, 1978, Nature.

Polytype formation in zirconium‐silicon thin films

F. d'Heurle, A. Bourret, A. Charai, 1990 .

Irradiation damage in nickel and iron in a high-voltage electron microscope and threshold energy determination

A. Bourret, 1971 .

High resolution and in situ investigation of defects in Bi-irradiated Si

J. Pénisson, A. Bourret, M. Ruault, 1984 .

Solving the Structure of Interfaces by High Resolution Electron Microscopy

A. Bourret, 1988 .

Dislocations stopped by the Σ = 9 (122 ) grain boundary in Si. An HREM study of thermal activation

J. Putaux, A. Bourret, H. Kirchner, 1989 .

Grain Boundaries in Semiconductors

J. Rouviere, A. Bourret, J. Thibault, 2013 .

Multiple Structures of a [001] Σ = 13 Tilt Grain Boundary in Germanium

J. Rouviere, A. Bourret, 1989 .

High-resolution electron microscopy of the high-temperature superconductor YBa2Cu3O7

E. Hewat, M. Dupuy, A. Bourret, 1987, Nature.

How to control the self-organization of nanoparticles by bonded thin layers

A. Bourret, 1999 .

The low-angle [011] tilt boundary in germanium II. Theoretical analysis of observed configurations and stability

A. Bourret, J. Desseaux, 1979 .

Multi-beam lattice images from germanium oriented in (011)

A. Renault, A. Bourret, J. Desseaux, 1977 .

Study of Agglomerated Defects in Irradiated Pure Nickel by Electron Microscopy

A. Bourret, D. Dautreppe, 1968 .

Time-resolved electron microscopy studies of the structure of nanoparticles and their melting

G. Deutscher, R. Kofman, P. Cheyssac, 2001 .

Strain relaxation in (0001) AlN/GaN heterostructures

C. Adelmann, G. Feuillet, J. Rouviere, 2001 .

Direct Observation of Monolayer Zones in Al-wt 4% Cu

A. Bourret, B. Jouffrey, D. Dorignac, 1990 .

In-situ high resolution observation of hydride precipitation in titanium

A. Bourret, S. Naka, A. Lasalmonie, 1986 .

High resolution determination of the core structure of 1/3⟨1120⟩ {1010} edge dislocation in titanium

S. Naka, A. de Crecy, A. Bourret, 1983 .

W. Schröter, A. Ourmazd, A. Bourret, 1984 .

High resolution and conventional electron microscopy studies of repeated wedge microtwins in monoclinic rare earth sesquioxides

A. Bourret, B. Yangui, G. Nihoul, 1983 .

High-resolution study of incoherent twin boundaries and of isolated wedge microtwins in rare-earth monoclinic sesquioxides (Ln2O3-B)

A. Bourret, B. Yangui, G. Nihoul, 1982 .

Growth of aluminum nitride on (111) silicon: Microstructure and interface structure

A. Barbier, G. Renaud, J. Rouviere, 1998 .

Atomic structure of [011] and [001] near-coincident tilt boundaries in germanium and silicon

C. D'anterroches, A. Bourret, 1984 .

ECR-MBE and GSMBE of Gallium nitride on Si(111)

J. Rouviere, A. Barski, A. Bourret, 1995 .

Defects created by self-implantation in Si as a function of temperature and fluence

A. Bourret, E. Ligeon, A. Chami, 1986 .

Electron microscopy and neutron diffraction studies of Ba2YCu3O7−δ compounds

A. Bourret, J. Rossat-Mignod, J. Henry, 1987 .

High resolution electron microscopy structure of Ba2YCu3O7 twin boundaries

E. Hewat, M. Dupuy, A. Bourret, 1987 .

Atomic structure of ion-sputtered Fe/Ti multilayers studied by HREM

J. Rouviere, A. Bourret, 1990 .

ON VACANCY CLUSTERS IN NEUTRON-IRRADIATED NICKEL AT LOW TEMPERATURE.

A. Bourret, A. Levelut, 1970 .

Evidence for vacancy migration at 220 k in iron, given by high voltage electron microscopy

J. Verdon, P. Moser, A. Bourret, 1982 .

Atomic structure of grain boundaries in semiconductors

A. Bourret, J. Bacmann, 1987 .

Atomic structure of grain boundaries in semiconductors studied by electron microscopy (analogy and difference with surfaces)

A. Bourret, J. Bacmann, 1985 .

Atomic Structure of Grain Boundaries

A. Bourret, 1985 .

Diamond hexagonal silicon phase and {113} defects Energy calculations and new defect models

A. Bourret, A. Parisini, 1993 .

Vacancy Defects in 3.0 MeV Electron Irradiated Molybdenum Single Crystal at 20 K

P. Moser, P. Hautojärvi, A. Bourret, 1987 .

Oxygen segregation on a dislocation core in germanium studied by electron energy loss spectroscopy

C. Colliex, A. Bourret, P. Trebbia, 1983 .

Core structure of the Lomer dislocation in germanium and silicon

A. Renault, A. Renault, A. Bourret, 1982 .

Crystallite Features of Valonia cellulose by Electron Diffraction and Dark‐Field Electron Microscopy

H. Chanzy, A. Bourret, R. Lázaro, 1972 .

Interdiffusion in Metallic Layers

J. Rouviere, A. Bourret, 1990 .

Magnetization Curves of Fe–Ni (50–50) Single Crystals Ordered by Neutron Irradiation with an Applied Magnetic Field

A. Bourret, A. Chamberod, J. Paulevé, 1968 .

Structure of GaAs=GaSb incoherent interface after epitaxial growth

P. Fuoss, A. Bourret, 1992 .

Solving Interface Structures by Combined Electron Microscopy and X-Ray Diffraction

G. Feuillet, A. Bourret, 1992 .

X-Ray Diffraction From Buried GaAs/GaSb Interfaces

P. Fuoss, A. Bourret, A. Rocher, 1990 .

Electron Microscopy of As Supersaturated Silicon

S. Solmi, P. Werner, A. Armigliato, 1986 .

X-ray absorption study of the atomic environment in Sb + and Sb + /B + implanted silicon

J. Allain, A. Armigliato, A. Bourret, 1992 .

Twin structure in coesite studied by high resolution electron microscopy

A. Bourret, H. .. Hochheimer, E. Hinze, 1986 .

Compliant substrates: a review on the concept, techniques and mechanisms

A. Bourret, A Bourret, 2000 .

Low-Density Silica Aerogels Observed by High-Resolution Electron Microscopy

A. Bourret, 1988 .

Structure determination of planar defects in crystals of germanium and molybdenum by HREM

J. Rouviere, J. Pénisson, A. Bourret, 1988 .

Direct Observation of Atomic Columns in Semiconductors by HREM at 400 kV

J. Rouviere, A. Bourret, A. Bourret, 1988, June 16.

Are the core structures of dislocations and grain boundaries resolvable by HREM?

C. D'anterroches, J. Pénisson, A. Bourret, 1983 .

Combined HREM and STEM microanalysis on decorated dislocation cores

C. Colliex, A. Bourret, 1982 .

High-resolution study of [011] low-angle tilt boundaries in aluminium

J. Pénisson, A. Bourret, 1979 .

Exhibition of surface steps by high resolution electron microscopy of monoclinic rare earth sesquioxides

A. Bourret, B. Yangui, G. Nihoul, 1984 .

Backscattering spectrometry and ion channeling studies of heavily implanted As+ in silicon

J. Allain, A. Armigliato, A. Bourret, 1994 .

Electrical activity and structural evolution correlations in laser and thermally annealed As‐implanted Si specimens

Sandro Solmi, M. Servidori, Aldo Armigliato, 1990 .

Calculated images of crystal lattices by axial illumination 1 MeV electrons

A. Renault, A. Bourret, J. Desseaux, 1975 .

Contrast of Small SiX Particles in Silicon by Computed HREM Images

S. Frabboni, A. Armigliato, A. Bourret, 1988, September 16.

R. Kofman, Guy Deutscher, G. Deutscher, 1997 .

Grain Boundary Structure Determination by HREM: A Comparison with Computer Relaxed Configurations for Pure Tilt in Germanium

J. Rouviere, A. Bourret, 1989 .

Silicon Bicrystal: Growth and Characterization

J. Aubert, A. Bourret, A. Rocher, 1981 .

HREM of SiP precipitates at the (111) silicon surface during phosphorus predeposition

W. Schröter, A. Bourret, 1984 .

How to induce the epitaxial growth of gallium nitride on Si(001)

J. Massies, N. Grandjean, J. Rouviere, 1995 .

High resolution electron microscopy of crystalline–amorphous interface: An indication to Eden aggregate

Y. Lereah, J. Pénisson, A. Bourret, 1992 .