S. Scherer

Focus Variation – a Robust Technology for High Resolution Optical 3D Surface Metrology

R. Danzl, F. Helmli, S. Scherer, 2011 .

Reconstruction of surface topographies by scanning electron microscopy for application in fracture research

Otmar Kolednik, M. Gruber, Jürgen Stampfl, 1996 .

Determination of the fracture toughness by automatic image processing

Otmar Kolednik, M. Gruber, Jürgen Stampfl, 1996 .

Robust, dense and accurate 3D surface reconstruction in SEM through automatic calibration data calculation from multiple images

M. Schmied, S. Scherer, H. Schroettner, 2004 .

Optical Measurement of Micro Cutting Tools

Franz Helmli, R Danzl, S Scherer, 2011 .

Adaptive shape from focus with an error estimation in light microscopy

S. Scherer, F. S. Helmli, F. Helmli, 2001, ISPA 2001. Proceedings of the 2nd International Symposium on Image and Signal Processing and Analysis. In conjunction with 23rd International Conference on Information Technology Interfaces (IEEE Cat..

Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)

M. Schmied, S. Scherer, H. Schroettner, 2006 .

Geometry and Volume Measurement of Worn Cutting Tools With an Optical Surface Metrology Device

R. Danzl, F. Helmli, S. Scherer, 2010 .

Subpixel Stereo Matching by Robust Estimation of Local Distortion Using Gabor Filters

Stefan Scherer, Axel Pinz, Peter Werth, 1999, CAIP.

Focus Variation - A New Technology for High Resolution Optical 3D Surface Metrology in the Micro- and Nanometer Range

Oliver Huber, S. Scherer, E. Cristea, 2009 .