A. Day

发表

The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

F. Brenker, A. Boyle, D. Prior, 1999 .

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

A. Wilkinson, R. Fortunier, K. Mingard, 2010, Ultramicroscopy.

A review of EBSD: from rudimentary on line orientation measurements to high resolution elastic strain measurements over the past 30 years.

A. Day, G. Meaden, D. Dingley, 2018, IOP Conference Series: Materials Science and Engineering.

Many-beam dynamical simulation of electron backscatter diffraction patterns.

Carol Trager-Cowan, Francis Sweeney, F. Sweeney, 2007, Ultramicroscopy.

Spherical Kikuchi Maps and Other Rarities

A. Day, 2009 .

Spherical EBSD

A. Day, 2008, Journal of microscopy.

Towards high accuracy calibration of electron backscatter diffraction systems.

K. Mingard, C. Maurice, A. Day, 2011, Ultramicroscopy.

Is fast mapping good mapping? A review of the benefits of high‐speed orientation mapping using electron backscatter diffraction

P. Trimby, A. Day, K. Mehnert, 2002, Journal of microscopy.

Three-Dimensional Texture Analysis

A. Day, J. Mulders, 2005 .

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

F. Sweeney, A. Wilkinson, P. Trimby, 2006 .

Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

F. Sweeney, A. Wilkinson, P. Trimby, 2006 .

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.

A. Wilkinson, P. Parbrook, B. Hourahine, 2012, Physical review letters.

Physical Properties of Alloys Relevant to Spray Forming

M. J. Richardson, R. Brooks, K. Mills, 1998 .

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

A. Vescan, K. Wang, B. Hourahine, 2013 .

Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

M. Tordjman, P. Parbrook, B. Hourahine, 2012 .

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

F. Sweeney, A. Wilkinson, P. Trimby, 2007 .

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

P. Parbrook, B. Hourahine, A. Day, 2012, Microscopy and Microanalysis.

A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods

T. Quested, A. Day, 1999, Journal of microscopy.

Crystallographic features of intergranular crack initiation in fatigued copper polycrystals

H. Mughrabi, W. Liu, A. Day, 1992 .

Recent developments in two fundamental aspects of electron backscatter diffraction

P N Quested, Ken Mingard, A. P. Day, 2014 .

Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood.

Roland Fortunier, Ken Mingard, Claire Maurice, 2010, Ultramicroscopy.

Electron backscatter diffraction studies of focused ion beam induced phase transformation in cobalt.

A. Day, D. Cox, H. Jones, 2016 .

Measurement of viscosities of metals and alloys with an oscillating viscometer

R. Brooks, K. Mills, A. Day, 2001 .

Etch diagnostics for new III–V and other semiconductors

A. Day, D. Klemperer, D. Field, 1990 .

Physical property measurements for the mathematical modeling of fluid flow in solidification processes

R. Brooks, K. Mills, A. Day, 1997 .

Reference materials for calibration of temperatures in DTA/DSC instruments.

A. Day, P. Quested, L. Chapman, 1999 .

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

V. O’Shea, K. Mingard, D. Maneuski, 2015 .