Jae-Chul Park

发表

Nanometer-scale oxide thin film transistor with potential for high-density image sensor applications.

U. Chung, J. Hur, Changjung Kim, 2011, ACS applied materials & interfaces.

Self-aligned top-gate amorphous gallium indium zinc oxide thin film transistors

Kee-Won Kwon, Young-soo Park, Eunha Lee, 2008 .

Short Channel Characteristics of Gallium–Indium–Zinc–Oxide Thin Film Transistors for Three-Dimensional Stacking Memory

Eunha Lee, Huaxiang Yin, Chang Jung Kim, 2008, IEEE Electron Device Letters.

Low‐Temperature‐Grown Transition Metal Oxide Based Storage Materials and Oxide Transistors for High‐Density Non‐volatile Memory

Young-soo Park, Huaxiang Yin, Seung-Eon Ahn, 2009 .

The influence of visible light on the gate bias instability of In–Ga–Zn–O thin film transistors

Sanghun Jeon, I-hun Song, Seung-Eon Ahn, 2011 .

P‐203L: Late‐News Poster: Analytical I‐V and C‐V Models for Amorphous InGaZnO TFTs and Their Application to Circuit Simulations

Changjung Kim, Y. Jeon, Je‐hun Lee, 2011 .

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

U-In Chung, Dong Myong Kim, Dae Hwan Kim, 2010, IEEE Transactions on Electron Devices.

Low-Frequency Noise Performance of a Bilayer InZnO–InGaZnO Thin-Film Transistor for Analog Device Applications

Changjung Kim, S. Jeon, S. I. Kim, 2010, IEEE Electron Device Letters.

Source/Drain Series-Resistance Effects in Amorphous Gallium–Indium Zinc-Oxide Thin Film Transistors

Kee-Won Kwon, Changjung Kim, Eunha Lee, 2008, IEEE Electron Device Letters.

Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

Dong Myong Kim, Dae Hwan Kim, Chang Jung Kim, 2008, IEEE Electron Device Letters.

Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

Dong Myong Kim, Changjung Kim, Young-soo Park, 2008 .

An Asynchronous Sampling-Based 128 $\times$ 128 Direct Photon-Counting X-Ray Image Detector with Multi-Energy Discrimination and High Spatial Resolution

Seung-Tak Ryu, Hyun-Sik Kim, Gyu-Hyeong Cho, 2013, IEEE Journal of Solid-State Circuits.

Enhanced light extraction efficiency of GaN-based light-emitting diodes with ZnO nanorod arrays grown using aqueous solution

Seong-Ju Park, Kyoung-Kook Kim, Kyoung-Kok Kim, 2009 .

High-performance amorphous gallium indium zinc oxide thin-film transistors through N2O plasma passivation

Changjung Kim, Young-soo Park, Sung-Hoon Lee, 2008 .

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

U-In Chung, Young-soo Park, Eunha Lee, 2009 .

Impact of transparent electrode on photoresponse of ZnO-based phototransistor

U. Chung, S. Ahn, Y. Jeon, 2013 .

Program/Erase Characteristics of Amorphous Gallium Indium Zinc Oxide Nonvolatile Memory

Huaxiang Yin, Chang Jung Kim, Ihun Song, 2008, IEEE Transactions on Electron Devices.

High Reliable and Manufacturable Gallium Indium Zinc Oxide Thin-Film Transistors Using the Double Layers as an Active Layer

Chang Jung Kim, I-hun Song, Jin-seong Park, 2009 .

Highly Stable Transparent Amorphous Oxide Semiconductor Thin‐Film Transistors Having Double‐Stacked Active Layers

Changjung Kim, Jang-Sik Lee, Ihun Song, 2010, Advanced materials.

Three-Dimensional Integration Approach to High-Density Memory Devices

U-In Chung, Hojung Kim, Sanghun Jeon, 2011, IEEE Transactions on Electron Devices.

Fully transparent nonvolatile memory employing amorphous oxides as charge trap and transistor’s channel layer

C. J. Kim, Young-soo Park, H. Yin, 2008 .

Self-Consistent Technique for Extracting Density of States in Amorphous InGaZnO Thin Film Transistors

C. J. Kim, Young-soo Park, D. M. Kim, 2010 .

Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

Dong Myong Kim, Sungwook Park, Dae Hwan Kim, 2010, IEEE Electron Device Letters.

Characteristics and Cleaning of Dry-Etching-Damaged Layer of Amorphous Oxide Thin-Film Transistor

Young-soo Park, Eunha Lee, Chang Jung Kim, 2009 .

Source/Drain Formation of Self-Aligned Top-Gate Amorphous GaInZnO Thin-Film Transistors by $\hbox{NH}_{3}$ Plasma Treatment

Changjung Kim, Eunha Lee, Huaxiang Yin, 2009, IEEE Electron Device Letters.

Impact of High-k HfO2 Dielectric on the Low-Frequency Noise Behaviors in Amorphous InGaZnO Thin Film Transistors

Changjung Kim, H. Kwon, Jae-Chul Park, 2010 .

P‐203L: Late‐News Poster: Analysis on AC Stress‐Induced Degradation Mechanism of Amorphous Indium‐Gallium‐Zinc‐Oxide Thin Film Transistor Inverters

U. Chung, Changjung Kim, Y. Jeon, 2010 .

Double gate GaInZnO thin film transistors

Huaxiang Yin, Y. S. Park, Donghun Kang, 2008 .

Density of States-Based DC $I$– $V$ Model of Amorphous Gallium–Indium–Zinc-Oxide Thin-Film Transistors

Dong Myong Kim, Dae Hwan Kim, Chang Jung Kim, 2009, IEEE Electron Device Letters.

Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure

Jae-Chul Park, Ho-Nyeon Lee, Tae Kwang Park, 2015, Displays.