Hojung Kim

Nanometer-scale oxide thin film transistor with potential for high-density image sensor applications.

U. Chung, J. Hur, Changjung Kim, 2011, ACS applied materials & interfaces.

Dual gate photo-thin film transistor with high photoconductive gain for high reliability, and low noise flat panel transparent imager

Kinam Kim, I. Yoo, U. Chung, 2011, International Electron Devices Meeting.

A plasma-treated chalcogenide switch device for stackable scalable 3D nanoscale memory

M. R. Uddin, D. Seo, I. Yoo, 2013, Nature Communications.

Influence of Hf contents on interface state properties in a-HfInZnO thin-film transistors with SiNx/SiOx gate dielectrics

U. Chung, Changjung Kim, J. Shin, 2011 .

The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility

U. Chung, Changjung Kim, J. Shin, 2012 .

Verification of Interface State Properties of a-InGaZnO Thin-Film Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics by Low-Frequency Noise Measurements

U. Chung, Changjung Kim, S. Jeon, 2011, IEEE Electron Device Letters.

Highly-scalable threshold switching select device based on chaclogenide glasses for 3D nanoscaled memory arrays

U-In Chung, Dongsoo Lee, Hojung Kim, 2012, 2012 International Electron Devices Meeting.

Three-Dimensional Integration Approach to High-Density Memory Devices

U-In Chung, Hojung Kim, Sanghun Jeon, 2011, IEEE Transactions on Electron Devices.