M. Borga
发表
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2020,
Applied Physics Express.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2017,
IEEE Transactions on Electron Devices.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
M. Meneghini,
G. Meneghesso,
F. Rampazzo,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2021,
Materials.
S. Decoutere,
J. Marek,
M. Borga,
2020,
2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM).
Gaudenzio Meneghesso,
Niels Posthuma,
Enrico Zanoni,
2018,
IEEE Transactions on Electron Devices.
S. Decoutere,
A. Tallarico,
N. Posthuma,
2021,
IEEE Transactions on Device and Materials Reliability.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2020,
IEEE Transactions on Electron Devices.
S. Decoutere,
D. Wellekens,
M. Meneghini,
2018,
MRS Communications.
S. Decoutere,
M. Bjork,
M. Meneghini,
2021,
Microelectronics Reliability.
S. Decoutere,
A. Neviani,
M. Meneghini,
2020,
2104.00939.
S. Decoutere,
A. Gerosa,
M. Meneghini,
2021,
Micromachines.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2020,
Materials.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2020,
Applied Physics Express.
Alex Q. Huang,
Yuhao Zhang,
Xu Li,
2018,
Journal of Physics D: Applied Physics.
S. Decoutere,
C. Fiegna,
E. Sangiorgi,
2022,
IEEE Electron Device Letters.
S. Decoutere,
A. Tallarico,
C. Fiegna,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Enrico Sangiorgi,
G. Meneghesso,
M. Meneghini,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
H. Ishida,
M. Meneghini,
G. Meneghesso,
2019,
IEEE Transactions on Electron Devices.
S. Decoutere,
A. Bevilacqua,
A. Neviani,
2022,
IEEE Transactions on Electron Devices.
S. Decoutere,
C. Fiegna,
N. Posthuma,
2021,
IEEE Transactions on Electron Devices.
S. Decoutere,
G. Meneghesso,
C. de Santi,
2022,
Applied Physics Letters.
S. Decoutere,
M. Meneghini,
G. Meneghesso,
2022,
IEEE International Reliability Physics Symposium.
S. Decoutere,
G. Meneghesso,
F. Rampazzo,
2022,
Microelectronics Reliability.
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini,
2019,
OPTO.
Gaudenzio Meneghesso,
Enrico Zanoni,
X. Li,
2018,
Microelectron. Reliab..
M. Borga,
K. Geens,
B. Bakeroot,
2022,
International Conference on Advanced Semiconductor Devices and Microsystems.
T. Detzel,
S. Decoutere,
M. Meneghini,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
S. Decoutere,
A. Neviani,
G. Meneghesso,
2022,
Microelectronics Reliability.
G. Meneghesso,
M. Meneghini,
P. Moens,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
S. Decoutere,
C. Fiegna,
E. Sangiorgi,
2022,
IEEE Transactions on Electron Devices.
Gaudenzio Meneghesso,
Niels Posthuma,
Enrico Zanoni,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
S. Decoutere,
D. Wellekens,
Tian-Li Wu,
2023,
IEEE Transactions on Electron Devices.
S. Decoutere,
D. Wellekens,
Tian-Li Wu,
2023,
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
S. Decoutere,
A. Neviani,
O. Syshchyk,
2022,
2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME).
S. Decoutere,
B. de Jaeger,
D. Wellekens,
2022,
IEEE Electron Device Letters.
S. Decoutere,
C. Fiegna,
N. Posthuma,
2023,
IEEE Transactions on Electron Devices.
M. Borga,
K. Geens,
B. Bakeroot,
2023,
Scientific reports.