S. Choi

Electro-thermal reliability study of GaN high electron mobility transistors

H. Kim, J. S. Lundh, B. Chatterjee, 2017, 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).

Thermal characterization of GaN vertical p-i-n diodes

R. Dupuis, J. S. Lundh, G. Pavlidis, 2017, 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).

Integrated temperature mapping of lateral gallium nitride electronics

H. Kim, J. S. Lundh, B. Chatterjee, 2017, Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.