C. Zhang

Electron-Induced Single-Event Upsets in Static Random Access Memory

J. K. Wang, peixiong zhao, R. Reed, 2013, IEEE Transactions on Nuclear Science.

Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices

Bin Wang, En Xia Zhang, M. L. Alles, 2011, IEEE Transactions on Nuclear Science.

Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs

R. D. Schrimpf, S. A. Francis, D. M. Fleetwood, 2012, IEEE Transactions on Nuclear Science.

Surface Reactions and Defect Formation in Irradiated Graphene Devices

peixiong zhao, E. Zhang, D. Fleetwood, 2012, IEEE Transactions on Nuclear Science.

Study of neutron irradiation effects in Depleted CMOS detector structures

V. Cindro, A. Gorišek, G. Kramberger, 2021, Journal of Instrumentation.