Takeomi Tamesada

发表

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2000, Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2005, 2005 IEEE International Symposium on Circuits and Systems.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, 13th Asian Test Symposium.
Masaki Hashizume, Takeomi Tamesada, H. Y. Kawai, 1989, 1989 Proceedings of the IEEE Custom Integrated Circuits Conference.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..
Takeshi Yano, Masaki Hashizume, Takeomi Tamesada, 1996 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, Systems and Computers in Japan.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.
Masaki Hashizume, Takeomi Tamesada, T. Kuchii, 1998, Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232).
Takeomi Tamesada, 1980, IEEE Transactions on Computers.
Masaki Hashizume, Takeomi Tamesada, Tomohisa Yamazoe, 1992, Proceedings First Asian Test Symposium (ATS `92).
Masaki Hashizume, Takeomi Tamesada, Toshimasa Kuchii, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2001, Proceedings 10th Asian Test Symposium.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).
Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.
Masaki Hashizume, Takeomi Tamesada, Takashi Shimamoto, 1997 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.
Masaki Hashizume, Takeomi Tamesada, H. Hoshika, 2000, Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637).
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, IEICE Trans. Inf. Syst..
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2002 .
Masaki Hashizume, Takeomi Tamesada, Yoshihiro Iwata, 1995 .
Takeomi Tamesada, 1988, Systems and Computers in Japan.
Masaki Hashizume, Koji Nii, Takeomi Tamesada, 1990, Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors.
Masaki Hashizume, Takeomi Tamesada, Toshimasa Kuchii, 1996, Proceedings of the Fifth Asian Test Symposium (ATS'96).
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, IEICE Trans. Inf. Syst..
Masaki Hashizume, Takeomi Tamesada, Isao Tsukimoto, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2001, Proceedings 10th Asian Test Symposium.
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2003 .
Masaki Hashizume, Takeomi Tamesada, T. Kuchii, 1997 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .
Masaki Hashizume, Takeomi Tamesada, Isao Tsukimoto, 1992, Proceedings First Asian Test Symposium (ATS `92).
Masaki Hashizume, Takeomi Tamesada, Akio Sakamoto, 1995 .
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2000, Proceedings of the Ninth Asian Test Symposium.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2006, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06).
Kozo Kinoshita, Masaki Hashizume, Takeomi Tamesada, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .
Hiroyuki Yotsuyanagi, Takeomi Tamesada, Massaki Hashizume, 2002 .
Masaki Hashizume, Takeomi Tamesada, Hirosuke Yamamoto, 1989, Systems and Computers in Japan.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .
Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2003, 2003 Test Symposium.
Masaki Hashizume, Takeomi Tamesada, K. Taga, 1995, Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing.
Kozo Kinoshita, Masaki Hashizume, Takeomi Tamesada, 1998 .
Masaki Hashizume, Takeomi Tamesada, Akio Sakamoto, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.
Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004 .