J. Pavelka

Noise in Submicron Metal?Oxide?Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position

V. Sedlakova, J. Sikula, M. Toita, 2012 .

RTS in Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation

J. Sikula, M. Toita, J. Pavelka, 2004 .

Comparison of three focus sensors for optical topography measurement of rough surfaces.

M. Holá, M. Šarbort, J. Oulehla, 2019, Optics express.

Noise in Submicron Metal–Oxide–Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position

V. Sedlakova, J. Sikula, M. Toita, 2012 .

Study of laser wobbling welding process through the radiation of plasma plume

P. Jedlicka, J. Pavelka, L. Mrňa, 2017 .

Amplitude of RTS noise in MOSFETs

J. Sikula, M. Toita, J. Pavelka, 2009, 2009 International Conference on Microelectronics - ICM.

Characterization of acoustic and electromagnetic emission sources

J. Sikula, P. Koktavy, J. Pavelka, 2004 .

Ultimate absolute Hooge parameter for semiconductors and graphene

T. Musha, J. Sikula, J. Pavelka, 2015, 2015 International Conference on Noise and Fluctuations (ICNF).

Dependence of Hooge constant on mean free paths of materials

Sumihisa Hashiguchi, Jan Pavelka, Saburo Yokokura, 2004, SPIE International Symposium on Fluctuations and Noise.

Activation Energy of RTS Noise

Josef Sikula, Munecazu Tacano, Masato Toita, 2011 .