X. Ge

A 0.5erms− Temporal Noise CMOS Image Sensor With Gm-Cell-Based Pixel and Period-Controlled Variable Conversion Gain

A. Theuwissen, X. Ge, 2017, IEEE Transactions on Electron Devices.

Analysis and calibration of process variations for an array of temperature sensors

A. Theuwissen, A. Abarca, S. Xie, 2017, 2017 IEEE SENSORS.

Temporal-Noise CMOS Image Sensor with Charge-Domain CDS and Period-Controlled Variable Conversion-Gain

A. Theuwissen, X. Ge, 2017 .

A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

A. Theuwissen, X. Ge, B. Mamdy, 2016, IMSE.

A BSI Global Shutter Pixel with Background Light Suppression for Multi-Frame Differential Imaging

G. Meynants, X. Ge, Karen Feyen, 2019 .

A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier

Albert Theuwissen, Xiaoliang Ge, A. Theuwissen, 2016, 2016 IEEE SENSORS.

Investigating transfer gate potential barrier by feed-forward effect measurement

Albert J. P. Theuwissen, Y. Xu, X. Ge, 2015 .