J. Bogdanowicz

发表

W. Vandervorst, J. Misiewicz, A. Schulze, 2018, Applied Physics Letters.

W. Vandervorst, J. Misiewicz, A. Charley, 2020 .

H. Bender, I. De Wolf, W. Vandervorst, 2017 .

A. Hikavyy, E. Rosseel, B. Douhard, 2019, ECS Journal of Solid State Science and Technology.

W. Vandervorst, J. Misiewicz, A. Schulze, 2020, Optics express.

W. Vandervorst, I. Wolf, A. Schulze, 2016 .

W. Vandervorst, P. Ferrari, J. Bogdanowicz, 2019, Ultramicroscopy.

J. Bogdanowicz, C. Fleischmann, W. Vandervorst, 2018, Journal of Applied Physics.

W. Vandervorst, S. Koelling, J. Bogdanowicz, 2013, Ultramicroscopy.

W. Vandervorst, T. Kelly, J. Bogdanowicz, 2014 .

W. Vandervorst, L. Arnoldi, F. Vurpillot, 2017, Ultramicroscopy.

A. Franquet, U. Celano, W. Vandervorst, 2017 .

W. Vandervorst, J. Bogdanowicz, C. Fleischmann, 2022, Microscopy and Microanalysis.

W. Vandervorst, J. Bogdanowicz, C. Fleischmann, 2022, Microscopy and Microanalysis.

Sylvain Barraud, Wilfried Vandervorst, Didier Blavette, 2017 .

G. Mannaert, H. Bender, D. Shamiryan, 2010 .

G. Mannaert, E. Rosseel, H. Bender, 2009 .

A. Satta, D. Vanhaeren, M. Meuris, 2006 .

A. Charley, D. Crotti, H. Sadeghian, 2022, Advanced Lithography.

P. Leray, G. Lorusso, A. Charley, 2022, Metrology, Inspection, and Process Control XXXVI.

Janusz Bogdanowicz, J. Bogdanowicz, 2012 .

W. Vandervorst, S. Koelling, J. Bogdanowicz, 2013, Optics express.

A. Charley, J. Bogdanowicz, P. Hönicke, 2023, Metrology, Inspection, and Process Control XXXVII.

E. Rosseel, W. Vandervorst, J. Bogdanowicz, 2009, 2009 17th International Conference on Advanced Thermal Processing of Semiconductors.

H. Mertens, P. Leray, G. Lorusso, 2022, Advanced Lithography.