C. Retsch

Accurate pattern registration for integrated circuit tomography

I. McNulty, Z. Levine, S. Grantham, 2001 .

Spatial coherence measurement of x-ray undulator radiation.

John C. Lin, C. T. Chantler, K. Nugent, 2001 .

Tomography of Integrated Circuit Interconnects

Ian McNulty, Markus Kuhn, Uwe Arp, 2001 .

X-ray Intensity Fluctuation Spectroscopy in the Energy Range from 1 to 4 keV

C. Retsch, C. C. Retsch, 2001 .

Si1−xGex gradient crystals: a new monochromator material for hard X-rays

Steffen Keitel, S. N. Rossolenko, Nikolay V. Abrosimov, 1998 .

Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy

Ian McNulty, Ismail C. Noyan, Cornelia C. Retsch, 2000 .

X-ray speckle contrast variation at a sample-specific absorption edges

I. McNulty, G. Stephenson, S. Frigo, 2000 .

Tomography of integrated circuit interconnect with an electromigration void

Ian McNulty, Uwe Arp, Thomas B. Lucatorto, 2000 .

Elastic coupling of silica gel dynamics in a liquid-crystal-aerosil dispersion.

I. McNulty, G. Iannacchione, C. Retsch, 2002, Physical review. E, Statistical, nonlinear, and soft matter physics.