M. Jech
发表
M. Lanza,
T. Grasser,
F. Schwierz,
2020,
Nature Communications.
T. Grasser,
M. Waltl,
K. Puschkarsky,
2019,
IEEE Transactions on Electron Devices.
T. Grasser,
M. Waltl,
K. Puschkarsky,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Karl Rupp,
Tibor Grasser,
Prateek Sharma,
2015,
2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
M. Jech,
L. Cvitkovich,
2022
.
A. De Keersgieter,
A. Chasin,
D. Linten,
2021,
Microelectronics Reliability.
T. Grasser,
M. Waltl,
G. Rzepa,
2020,
IEEE Transactions on Electron Devices.
T. Grasser,
B. Kaczer,
J. Franco,
2018
.
On the effect of interface traps on the carrier distribution function during hot-carrier degradation
T. Grasser,
B. Kaczer,
J. Franco,
2016,
2016 IEEE International Integrated Reliability Workshop (IIRW).
T. Grasser,
S. Tyaginov,
M. Jech,
2016
.
A. De Keersgieter,
A. Chasin,
D. Linten,
2020,
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
A. Chasin,
D. Linten,
T. Grasser,
2019,
IEEE Electron Device Letters.
T. Grasser,
G. Rzepa,
G. Pobegen,
2018,
2018 International Integrated Reliability Workshop (IIRW).
T. Grasser,
M. Jech,
L. Cvitkovich,
2022,
Applied Surface Science.
A. Makarov,
S. Tyaginov,
M. Vexler,
2022,
Physical Review Materials.
M. Jech,
Dominic Waldhoer,
D. Milardovich,
2022,
Solid-State Electronics.
M. Lanza,
T. Grasser,
F. Schwierz,
2020,
Nature Communications.
T. Grasser,
M. Waltl,
G. Rzepa,
2019,
IEEE Transactions on Electron Devices.
Tibor Grasser,
Alexander L. Shluger,
Wolfgang Gös,
2018,
Microelectron. Reliab..
A. Subirats,
Dimitri Linten,
Geert Hellings,
2018,
Microelectron. Reliab..
B. Kaczer,
T. Grasser,
D. Linten,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
G. Rzepa,
A. Shluger,
2017
.
T. Grasser,
M. Waltl,
C. Jungemann,
2021,
Physical Review Applied.
T. Grasser,
A. Shluger,
S. Tyaginov,
2019,
Physical Review B.
T. Grasser,
B. Kaczer,
J. Franco,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
Tibor Grasser,
Jacopo Franco,
Ben Kaczer,
2016,
IEEE Electron Device Letters.
A. Chasin,
B. Kaczer,
G. Eneman,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Tibor Grasser,
Prateek Sharma,
Hajdin Ceric,
2016
.
T. Grasser,
G. Pobegen,
M. Jech,
2021,
IEEE Transactions on Electron Devices.
M. Waltl,
M. Jech,
A. El-Sayed,
2022,
Microelectronics Reliability.
M. Waltl,
M. Jech,
L. Cvitkovich,
2022,
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
T. Grasser,
G. Pobegen,
M. Jech,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
T. Grasser,
M. Jech,
L. Cvitkovich,
2021,
European Solid-State Device Research Conference.
T. Grasser,
M. Waltl,
G. Rzepa,
2020,
2020 IEEE International Integrated Reliability Workshop (IIRW).
T. Grasser,
B. Kaczer,
J. Franco,
2018
.
A. Chasin,
D. Linten,
T. Grasser,
2018,
Semiconductors.
A. De Keersgieter,
A. Chasin,
D. Linten,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
T. Grasser,
M. Waltl,
B. Kaczer,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Dimitri Linten,
Geert Hellings,
Ben Kaczer,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).