Hag-ju Cho

发表

K. Onishi, R. Choi, J.C. Lee, 2001, Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537).

K. Onishi, S. Krishnan, R. Choi, 2002, Digest. International Electron Devices Meeting,.

K. Onishi, S. Krishnan, R. Choi, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

K. Onishi, S. Krishnan, R. Choi, 2002, 60th DRC. Conference Digest Device Research Conference.

K. Onishi, R. Choi, J.C. Lee, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

T. Schram, B. O’Sullivan, T. Witters, 2007, ECS Transactions.

S. Van Elshocht, A. Akheyar, S. Biesemans, 2008, IEEE Electron Device Letters.

Jong-Ho Lee, Hag-Ju Cho, Nae-In Lee, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..

J.C. Lee, M.S. Akbar, J.C. Lee, 2004, IEEE Transactions on Electron Devices.

K. Onishi, S. Krishnan, R. Choi, 2002, Digest. International Electron Devices Meeting,.

K. Onishi, R. Choi, H. Cho, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).