G. Rott
发表
T. Grasser,
G. Rzepa,
K. Puschkarsky,
2019,
IEEE Transactions on Electron Devices.
T. Grasser,
K. Puschkarsky,
H. Reisinger,
2019,
IEEE Transactions on Electron Devices.
T. Grasser,
M. Waltl,
K. Puschkarsky,
2019,
IEEE Transactions on Electron Devices.
T. Grasser,
M. Waltl,
G. Rzepa,
2020,
IEEE Transactions on Electron Devices.
Tibor Grasser,
Jacopo Franco,
Ben Kaczer,
2014,
2014 IEEE International Conference on IC Design & Technology.
Katja Puschkarsky,
Wolfgang Gustin,
Christian Schlünder,
2018,
Microelectron. Reliab..
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Hans Reisinger,
Wolfgang Gustin,
Gunnar Andreas Rott,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.