S. Mei
发表
K. Pey,
N. Raghavan,
M. Bosman,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
K. Pey,
N. Raghavan,
M. Bosman,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Xing Wu,
Nagarajan Raghavan,
Michel Bosman,
2016,
Microelectron. Reliab..
N. Raghavan,
K. Pey,
N. Raghavan,
2019,
Microelectronic Engineering.
H. Wong,
K. Pey,
N. Raghavan,
2017
.
L. Larcher,
A. Padovani,
F. Puglisi,
2019,
IEEE Electron Device Letters.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Xing Wu,
Nagarajan Raghavan,
Michel Bosman,
2015
.
Nagarajan Raghavan,
Alok Ranjan,
Michel Bosman,
2016,
Microelectron. Reliab..
Nagarajan Raghavan,
Kin Leong Pey,
J. H. Lim,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
K. L. Pey,
N. Raghavan,
S. Mei,
2018,
IEEE Transactions on Electron Devices.
A. Ranjan,
N. Raghavan,
K. Shubhakar,
2018,
Scientific Reports.