M. Glorieux

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

H. Puchner, V. Ferlet-Cavrois, F. Wrobel, 2020, IEEE Transactions on Nuclear Science.

2015 JETTA Reviewers

Robert Wille, Yong-Bin Kim, Alexandre M. Amory, 2016, Journal of electronic testing.

Heavy ions test result on a 65nm Sparc-V8 radiation-hard microprocessor

G. Gasiot, P. Roche, J. M. Daveau, 2014, 2014 IEEE International Reliability Physics Symposium.

Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

Li Chen, Richard Wong, Rui Liu, 2017, IEEE Transactions on Nuclear Science.

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

G. Gasiot, P. Roche, D. Munteanu, 2014, IEEE Transactions on Nuclear Science.

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits

Sylvain Clerc, Philippe Roche, Jean-Luc Autran, 2014, Microelectron. Reliab..