E. Faraud

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

E. Lorfèvre, R. Ecoffet, V. Pouget, 2011, IEEE Transactions on Nuclear Science.

Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis

V. Pouget, D. Lewis, E. Faraud, 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing.

V. Pouget, D. Lewis, E. Faraud, 2011, Optics express.