Xiaoming Jin

Single-Event Upsets in SRAMs With Scaling Technology Nodes Induced by Terrestrial, Nuclear Reactor, and Monoenergetic Neutrons

Fengqi Zhang, Wei Chen, Xiaoqiang Guo, 2019, IEEE Transactions on Nuclear Science.

The effects of gamma irradiation on neutron displacement sensitivity of lateral PNP bipolar transistors

Wei Chen, Yan Liu, Chenhui Wang, 2016 .

Simulation of synergistic effects on lateral PNP bipolar transistors induced by neutron and gamma irradiation

Wei Chen, L. Ding, Yan Liu, 2015 .

Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses

Andrea Baschirotto, Alessandro Paccagnella, Christian Enz, 2019, IEEE Transactions on Nuclear Science.

Single event upset on static random access memory devices due to spallation, reactor, and monoenergetic neutrons

Wei Chen, Yan Liu, Xiaoqiang Guo, 2019, Chinese Physics B.

Ionizing and non-ionizing kerma factors in silicon for China Spallation Neutron Source neutron spectrum

Wei Chen, Yan Liu, Xiaoqiang Guo, 2019, Nuclear Science and Techniques.

Ionizing/displacement synergistic effects induced by gamma and neutron irradiation in gate-controlled lateral PNP bipolar transistors

Wei Chen, Zhikuan Wang, Zhibin Yao, 2016 .

Hydrodynamic and Geostress Controls on CBM Enrichment in the Anze Block, Southern Qinshui Basin, North China

Yidong Cai, Dameng Liu, Yongkai Qiu, 2022, Geofluids.

Numerical simulation of the influence of electron injections on the short-term annealing in pulse-neutron-irradiated p-type Si

Guizhen Wang, Wei Chen, Yan Liu, 2019, AIP Advances.

Dependence on Base Width and Doping Concentration of Current Degradation in Gate-controlled Lateral PNP Bipolar Transistors Exposed to Reactor Neutrons and Gamma Rays

Wei Chen, Yan Liu, Chenhui Wang, 2017 .

Temperature-dependent analysis and correction in a neutron fluence real-time measuring circuit

Chao Qi, Xiaoming Jin, Ruibin Li, 2023, Microelectronics Reliability.

Charge Buildup and Spatial Distribution of Interface Traps in 65-nm pMOSFETs Irradiated to Ultrahigh Doses

Federico Faccio, Alessandro Paccagnella, Daniel M. Fleetwood, 2019, IEEE Transactions on Nuclear Science.

The impact of reactor neutron irradiation on total ionizing dose degradation in MOSFET

Wei Chen, Yan Liu, Xiaoqiang Guo, 2019, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.