Y. Danto
发表
L. Béchou,
S. Mejdi,
Y. Ousten,
1996
.
L. Béchou,
F. Verdier,
Y. Ousten,
2021,
Advanced Laser Diode Reliability.
Philippe Perdu,
Dean Lewis,
Felix Beaudoin,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
G. N'Kaoua,
C. Pellet,
Y. Danto,
1997
.
L. Vandamme,
Y. Danto,
M. Perichaud,
1999
.
L. Vandamme,
Y. Danto,
M. Perichaud,
1999
.
N. Zerounian,
L. Béchou,
F. Aniel,
2006,
IPFA 2006.
M. Renaud,
L. Béchou,
Y. Danto,
2003,
International Conference onIndium Phosphide and Related Materials, 2003..
Hélène Fremont,
Yves Danto,
A. Fleury,
1995
.
Jean-Yves Delétage,
Hélène Fremont,
Frédéric Verdier,
2001
.
P. Perdu,
A. Touboul,
N. Labat,
1998,
1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100).
P. Hagenmuller,
A. Levasseur,
Y. Danto,
1983
.
T. Zimmer,
A. Touboul,
N. Labat,
1992
.
Olivier Bonnaud,
François Verdier,
Pascal Fouillat,
2003
.
M. Vanzi,
L. Béchou,
F. Verdier,
1990,
2013 IEEE 20th Symposium on Communications and Vehicular Technology in the Benelux (SCVT).
Y. Danto,
J. Manaud,
L. Niewohner,
1989
.
Y. Danto,
J. Chemin,
A. Barrière,
1975
.
Y. Danto,
P. Castillan,
B. Plano,
1994,
Proceedings of 16th IEEE/CPMT International Electronic Manufacturing Technology Symposium.
J. Delétage,
Y. Danto,
H. Frémont,
2004
.
Y. Danto,
H. Fremont,
M. Salagoity,
1998,
Twenty Third IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.98CH36205).
Cristell Maneux,
N. Labat,
A. Touboul,
2001
.
C. Maneux,
A. Touboul,
N. Labat,
1999,
1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401).
C. Maneux,
A. Touboul,
N. Malbert,
1999
.
C. Maneux,
A. Touboul,
N. Labat,
1997,
Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Maneux,
N. Labat,
Y. Danto,
1996,
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.
J. Delétage,
Y. Danto,
A. Pintus,
2001
.
Y. Danto,
J. Pistré,
Y. Segui,
1979
.
Y. Danto,
H. Frémont,
M. Brizoux,
2008,
EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.
T. Duc,
Y. Danto,
A. Barrière,
1982
.
Jean-Yves Delétage,
Yves Danto,
Frédéric Verdier,
2003,
Microelectron. Reliab..
Kirsten Weide-Zaage,
Yves Danto,
David Dalleau,
2003,
Microelectron. Reliab..
J. Delétage,
L. Béchou,
Y. Ousten,
1996,
Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium.
Y. Ousten,
D. Lewis,
V. Pouget,
2005,
IEEE Transactions on Device and Materials Reliability.
Y. Ousten,
Y. Danto,
J. Schulte,
1986
.
Laurent Bechou,
Y. Danto,
Y. Deshayes,
2005
.
R. Gibaud,
Y. Danto,
G. Couturier,
1981
.
A. Hakam,
Y. Danto,
G. Couturier,
1981
.
Y. Danto,
J. Pistré,
G. Couturier,
1979
.
Y. Danto,
G. Couturier,
C. Sribi,
1984
.
A. Hakam,
Y. Danto,
G. Couturier,
1981
.
C. Lucat,
Y. Danto,
J. Pistré,
1978
.
F. Fantini,
P. Cova,
A. Touboul,
1997
.
Y. Danto,
Hélène Fremont,
Jean-Yves Deletage,
2000
.
Yves Danto,
Wolfgang Wondrak,
Yves Ousten,
2002,
Microelectron. Reliab..
Jean-Michel Dumas,
Nathalie Labat,
Nathalie Saysset,
1996
.
Frédéric Verdier,
Yves Danto,
J.-Y. Deltage,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
V. Quintard,
S. Dilhaire,
W. Claeys,
1993
.
Y. Danto,
D. Dallet,
D. Dallet,
1997,
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings.
Yves Danto,
J. P. Dom,
Stefan Dilhaire,
1993
.