Y. Chun

发表

Time-censored ramp tests with stress bound for Weibull life distribution

D. Bai, Y. Chun, M. Cha, 1997 .

Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring

D. Bai, Y. Chun, S. W. Chung, 1993 .

DESIGN OF FAILURE-CENSORED ACCELERATED LIFE-TEST SAMPLING PLANS FOR LOGNORMAL AND WEIBULL DISTRIBUTIONS

Do Sun Bai, J. G. Kim, D. Bai, 1993 .

Optimum simple step-stress accelerated life-tests with competing causes of failure

Do Sun Bai, D. Bai, Y. Chun, 1991 .

Failure-censored accelerated life test sampling plans for Weibull distribution under expected test time constraint

Do Sun Bai, J. G. Kim, D. Bai, 1995 .

Nonparametric inferences for ramp stress tests under random censoring

Do Sun Bai, D. Bai, Y. Chun, 1993 .