Tan-Chen Lee

Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications

C. Kübel, A. Voigt, R. Schoenmakers, 2005, Microscopy and Microanalysis.

Nanometer-Scale Oxide Particles in Gesi Films Grown by Wet Oxidation

Y. Shacham-Diamand, J. Silcox, R. Soave, 1993 .

Raman and Spectroscopic Ellipsometry Studies of P-Doped Poly-Si

W. Paulson, S. Zollner, Ran Liu, 1998 .

Interface Stability During Solid Phase Epitaxy Of Strained Ge x S 1- x Films on Si (100)

J. Silcox, M. Thompson, Tan-Chen Lee, 1993 .

Recent Advances in Electron Tomography : TEM and HAADF-STEM Tomography for Materials Science and IC Applications-TEM and STEM Tomography for Materials

H. Engelmann, C. Kübel, A. Voigt, 2006 .