Y. Picard

J. P. McDonald, D. Adams, S. Yalisove, 2009, 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference.

Cutting Reactive Foils Without Igniting Them (A Femtosecond Laser Machining Approach)

T. P. Weihs, J. P. McDonald, D. Adams, 2003 .

High-throughput Characterization of Surface Segregation in CuxPd1-x Alloys

D. Priyadarshini, B. Morreale, A. Gellman, 2011 .

Glide of threading edge dislocations after basal plane dislocation conversion during 4H–SiC epitaxial growth

M. Skowronski, T. Sudarshan, Y. Picard, 2015 .

In situ biasing TEM investigation of resistive switching events in TiO2-based RRAM

J. Bain, M. Skowronski, Y. Picard, 2014, 2014 IEEE International Reliability Physics Symposium.

Epitaxial SiC Growth Morphology and Extended Defects Investigated by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

P. Neudeck, C. Eddy, M. Twigg, 2008 .

Simulation and analysis of electron channeling contrast images of threading screw dislocations in 4H-SiC

M. Twigg, Y. Picard, 2009 .

Controlled Growth of Parallel Oriented ZnO Nanostructural Arrays on Ga2O3 Nanowires

Sharka M. Prokes, Yoosuf N. Picard, Lena Mazeina, 2009 .

Dopant segregation in YAG single crystal fibers grown by the laser heated pedestal growth technique

Y. Picard, P. Ohodnicki, M. Buric, 2020 .

Pulsed laser ignition of reactive multilayer films

D. Adams, S. Yalisove, Y. Picard, 2006 .

Identifying threading dislocations in GaN films and substrates by electron channelling

R. Davis, L. Porter, D. Koleske, 2011, Journal of microscopy.

Diffraction contrast and Bragg reflection determination in forescattered electron channeling contrast images of threading screw dislocations in 4H-SiC

M. Twigg, Y. Picard, 2008 .

Oxygen Vacancy Creation, Drift, and Aggregation in TiO2‐Based Resistive Switches at Low Temperature and Voltage

James A. Bain, Marek Skowronski, Yoosuf N. Picard, 2015 .

In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2

Wenhao Chen, J. Bain, M. Skowronski, 2014, Microscopy and Microanalysis.

Theory of dynamical electron channeling contrast images of near-surface crystal defects.

M. Graef, M. De Graef, Y. Picard, 2014, Ultramicroscopy.

Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

P. Neudeck, C. Eddy, M. Twigg, 2007 .

Diffraction Contrast of Threading Dislocations in GaN and 4H-SiC Epitaxial Layers Using Electron Channeling Contrast Imaging

P. Neudeck, C. Eddy, M. Twigg, 2010 .

Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging

M. Graef, S. Ringel, J. Carlin, 2014 .

Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling

M. Graef, N. T. Nuhfer, Y. Picard, 2012, Microscopy Today.

Imaging Surface Pits and Dislocations in 4H-SiC by Forescattered Electron Detection and Photoluminescence

M. Twigg, R. Stahlbush, Y. Picard, 2008 .

Simulation of Forescattered Electron Channeling Contrast Imaging of Threading Dislocations Penetrating SiC Surfaces

P. Neudeck, C. Eddy, M. Twigg, 2008 .

Nondestructive defect measurement and surface analysis of 3C-SiC on Si (001) by electron channeling contrast imaging

S. Saddow, C. Frewin, C. Locke, 2008 .

Applications of Electron Channeling Contrast Imaging for the Rapid Characterization of Extended Defects in III–V/Si Heterostructures

Steven A. Ringel, David W. McComb, Yoosuf N. Picard, 2015, IEEE Journal of Photovoltaics.

Direct observation of basal-plane to threading-edge dislocation conversion in 4H-SiC epitaxy

M. Skowronski, V. Wheeler, R. Myers-Ward, 2011 .

Nondestructive dislocation delineation using topographically enhanced imaging of surface morphologies in 4H-SiC epitaxial layers

M. Skowronski, M. Twigg, R. Stahlbush, 2008 .

Relating Precursor Pyrolysis Conditions and Aqueous Electrolyte Capacitive Energy Storage Properties for Activated Carbons Derived from Anhydrous Glucose-d

J. Whitacre, Sang‐Eun Chun, Y. Picard, 2011 .

Small fatigue crack propagation from micronotches in the cast aluminum alloy W319

Steven M. Yalisove, John E. Allison, Yoosuf N. Picard, 2004 .

Effects of Cr Concentration on Cementite Coarsening in Ultrahigh Carbon Steel

B. Webler, Y. Picard, M. Hecht, 2019, Metallurgical and Materials Transactions A.

Coarsening of Inter- and Intra-granular Proeutectoid Cementite in an Initially Pearlitic 2C-4Cr Ultrahigh Carbon Steel

B. Webler, Y. Picard, M. Hecht, 2017, Metallurgical and Materials Transactions A.

Grain growth stagnation and texture development in an irradiated thermally stabilized nanocrystalline alloy

L. Shao, M. D. de Boer, Y. Picard, 2019, Journal of Applied Physics.

Femtosecond laser micromachining of a single-crystal superalloy

Gerard Mourou, Tresa M. Pollock, Qiang Feng, 2005 .

Micromachining Imposed Subsurface Plastic Deformation in Single-Crystal Aluminum

O. B. Ozdoganlar, Sudhanshu Nahata, Y. Picard, 2020, Materials Characterization.

Growth and photoluminescence properties of vertically aligned SnO2 nanowires

S. Prokes, J. Caldwell, E. Glaser, 2009 .

Growth of Sn-Doped β-Ga2O3 Nanowires and Ga2O3−SnO2 Heterostructures for Gas Sensing Applications

Jaime A. Freitas, F. Keith Perkins, Sharka M. Prokes, 2009 .

Cathodoluminescence studies of the inhomogeneities in Sn-doped Ga2O3 nanowires.

S. Maximenko, J. A. Freitas, S. Prokes, 2009, Nano letters.

Exchange bias in a single phase ferrimagnet

R. Stroud, S. Wolf, N. Bassim, 2010 .

In Situ Platform for Isothermal Testing of Thin-Film Mechanical Properties Using Thermal Actuators

J. Beuth, M. D. de Boer, Mohamed E. Saleh, 2015, Journal of Microelectromechanical Systems.

Scanning Electron Microscopy

Y. Picard, 2019, Materials Characterization.

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

J. Freitas, P. Klein, K. Lew, 2010 .

Local heating-induced plastic deformation in resistive switching devices

James A. Bain, Marek Skowronski, Paul A. Salvador, 2011 .

Dislocation impact on resistive switching in single-crystal SrTiO3

Wenhao Chen, J. Bain, M. Skowronski, 2013 .

Nucleation of in-grown stacking faults and dislocation half-loops in 4H-SiC epitaxy

M. Skowronski, V. Wheeler, R. Myers-Ward, 2013 .

Effects of Nitrogen Doping on Basal Plane Dislocation Reduction in 8° Off-Cut 4H-SiC Epilayers

M. Skowronski, V. Wheeler, R. Myers-Ward, 2011 .

Dislocation Nucleation and Growth in MOCVD GaN/AlN Films on Stepped and Step-free 4H-SiC Mesa Substrates

P. Neudeck, C. Eddy, M. Twigg, 2008 .

Digital image analysis to quantify carbide networks in ultrahigh carbon steels

B. Webler, Y. Picard, M. Hecht, 2016 .

Femtosecond laser heat affected zones profiled in Co∕Si multilayer thin films

S. Yalisove, Y. Picard, 2008 .

Imaging Dislocations in Single-Crystal SrTiO3 Substrates by Electron Channeling

Y. Picard, Wenkan Jiang, Ranga J. Kamaladasa, 2011 .

Experimental Investigation of Sub-Surface Deformation using EBSD in Single Crystal Aluminum during Orthogonal Micromachining

O. B. Ozdoganlar, Sudhanshu Nahata, Y. Picard, 2014 .

Electrical and Optical Characterization of AlGaN/GaN HEMTs with In Situ and Ex Situ Deposited SiNx Layers

Fritz J. Kub, Jennifer K. Hite, Michael A. Mastro, 2010 .

Nanoscale Analysis of LSM/YSZ Interfaces within Composite Cathodes for Commercial Solid Oxide Fuel Cells

Shiwoo Lee, H. Abernathy, J. Poplawsky, 2021, ECS Meeting Abstracts.

Synthesis of Group IV Nanowires on Graphene: The Case of Ge Nanocrawlers.

Tzahi Cohen-Karni, Sahil K. Rastogi, Y. Picard, 2016, Nano letters.

Erratum to: UHCSDB: UltraHigh Carbon Steel Micrograph DataBase

Brian L. DeCost, E. Holm, T. Francis, 2017, Integrating Materials and Manufacturing Innovation.

Synthesis of Group IV Nanowires on Graphene: The Case of Ge Nanocrawlers.

Tzahi Cohen-Karni, Sahil K. Rastogi, Y. Picard, 2016, Nano letters.

Rapid characterization of extended defects in III–V/Si by electron channeling contrast imaging

S. Ringel, J. Carlin, T. Grassman, 2014, 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC).

Role of a native oxide on femtosecond laser interaction with silicon (100) near the damage threshold

J. P. McDonald, S. Yalisove, Y. Picard, 2005 .